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Volume 15 - April 2009

Contents

Page 27 of 47

Instrumentation and Techniques

Electron Diffraction and Imaging Techniques for Quantitative Structure Determination

Abstract

  • Atomic-Resolution Imaging of Crystals Using Charge Flipping and Precession Electron Diffraction

  • H Hu, J-M Zuo
  • Published online by Cambridge University Press:
    26 July 2009, pp. 740-741
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Ab Initio Undersampled Phase Retrieval

  • S Marchesini
  • Published online by Cambridge University Press:
    26 July 2009, pp. 742-743
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Reconstruction of Atomic Columns in Silicon by Electron Diffractive Imaging

  • S Morishita, J Yamasaki, K Nakamura, T Kato, N Tanaka
  • Published online by Cambridge University Press:
    26 July 2009, pp. 744-745
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • 10-kV Electron-Diffractive Imaging of Multiwall Carbon Nanotube

  • O Kamimura, T Dobashi, K Kawahara, Y Maehara, K Gohara
  • Published online by Cambridge University Press:
    26 July 2009, pp. 746-747
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Electron Diffractive Imaging of a Single Nanoparticle

  • F-R Chen, R Dronyak, C-K Feng, KS Liang, T-K Lee
  • Published online by Cambridge University Press:
    26 July 2009, pp. 748-749
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • A STEM Parallel Diffraction Technique Applied to Nanomaterials

  • KJ Ganesh, M Kawasaki, JP Zhou, PJ Ferreira
  • Published online by Cambridge University Press:
    26 July 2009, pp. 752-753
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Fast Multislice Simulation of Scanning Transmission Electron Microscope Images

  • C Dwyer
  • Published online by Cambridge University Press:
    26 July 2009, pp. 754-755
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • High Throughput Automated Crystal Orientation and Phase Mapping of Nanoparticles from HREM - TEM Images

  • EF Rauch, S Rouvimov, S Nicolopoulos, P Moeck
  • Published online by Cambridge University Press:
    26 July 2009, pp. 756-757
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Nanocrystal Structure Determination by Kinematic Convergent-Beam Electron Diffraction

  • JT McKeown, JCH Spence
  • Published online by Cambridge University Press:
    26 July 2009, pp. 758-759
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Electron Diffraction from Liquids Jets in TEM

  • DP DePonte, JT McKeown, M Hunter, RB Doak, U Weierstall, JCH Spence
  • Published online by Cambridge University Press:
    26 July 2009, pp. 762-763
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Quantitative Analysis Carbon-Carbon Bonds in a Multiwall Carbon Nanotube using Electron Diffraction

  • J Zhang, J-M Zuo
  • Published online by Cambridge University Press:
    26 July 2009, pp. 764-765
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Determination of Crystal Structure from Electron Backscatter Diffraction Patterns

  • SI Wright, DJ Dingley, MM Nowell
  • Published online by Cambridge University Press:
    26 July 2009, pp. 766-767
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Technique for Fitting Complex Probes in Nano-Beam Diffraction

  • R McLeod, M Malac
  • Published online by Cambridge University Press:
    26 July 2009, pp. 768-769
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Nanometer Scale Atomic Order in a Bulk Metallic Glass from Fluctuation Microscopy

  • J Hwang, P Voyles
  • Published online by Cambridge University Press:
    26 July 2009, pp. 770-771
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Quantitative Analysis of Point Defects in an Ideal Quasicrystal by Aberration-Corrected Z-Contrast STEM

  • E Abe, T Seki, SJ Pennycook
  • Published online by Cambridge University Press:
    26 July 2009, pp. 772-773
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Determining Projected Symmetries for Structural Fingerprinting of Nanocrystals

  • P Moeck, S Rouvimov
  • Published online by Cambridge University Press:
    26 July 2009, pp. 776-777
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Metallographic Techniques & Materials Characterization

Abstract

  • Quantitative Evaluation of Metallographic Preparation Quality using EBSD

  • PT Pinard, P Hovington, M Lagacé, GM Lucas, GF Vander Voort, R Gauvin
  • Published online by Cambridge University Press:
    26 July 2009, pp. 778-779
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Page 27 of 47