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Reference Material (RM) 8820: A New Scanning Electron Microscope Scale Calibration Artifact

Published online by Cambridge University Press:  26 July 2009

AE Vladár  and
MT Postek
AE Vladár
Affiliation:
National Institute of Standards and Technology
MT Postek
Affiliation:
National Institute of Standards and Technology

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Information
Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 668 - 669
Copyright
Copyright © Microscopy Society of America 2009