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Volume 15 - April 2009

Contents

Page 22 of 47

Instrumentation and Techniques

Problem Solving Using Microanalysis in the Real World

Abstract

  • Laser Ablation Inductively Coupled Mass Spectrometry for in situ Trace Element and Isotope Analysis

  • RD Ash
  • Published online by Cambridge University Press:
    26 July 2009, pp. 538-539
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Microanalysis Data Formats: Are We Even Asking the Right Questions?

  • JH Scott, N Ritchie
  • Published online by Cambridge University Press:
    26 July 2009, pp. 540-541
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Solving the Micro to Macro Problem: A New Application for Milli X-ray Fluorescence X-ray Spectrum Imaging

  • JM Davis, DE Newbury, N Ritchie, EP Vicenzi
  • Published online by Cambridge University Press:
    26 July 2009, pp. 542-543
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Strategies for the Microcharacterization of Structural Defects in Wide Band Gap Materials Using Cathodoluminescence Microanalysis.

  • M Stevens-Kalceff
  • Published online by Cambridge University Press:
    26 July 2009, pp. 544-545
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • How Much EDS Resolution Do I Need?

  • NA Bulloss
  • Published online by Cambridge University Press:
    26 July 2009, pp. 546-547
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Characterization of Thin Film CuCr2Se4 Synthesized by A Modulated Elemental Reactant Deposition

  • MD Anderson, J Roberts, K Kirchgessner, L LaRossa, IM Anderson, DC Johnson
  • Published online by Cambridge University Press:
    26 July 2009, pp. 550-551
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Nano Analysis of Silver Nanoparticles in Commercial Socks

  • A Hemmati, K Scott, JM Davis
  • Published online by Cambridge University Press:
    26 July 2009, pp. 552-553
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Investigations on Toxic Compound Traces in Powders and Sintered Ceramics

  • J-L Longuet
  • Published online by Cambridge University Press:
    26 July 2009, pp. 556-557
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Resampling of SEM-EDS Element Maps to Assess the Length-Scale of Elemental Heterogeneity

  • C Todd, W Heeschen, A Pyzik, C Han
  • Published online by Cambridge University Press:
    26 July 2009, pp. 558-559
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Improved Performance of a Commercial SDD for X-ray Microanalysis

  • E Kenik
  • Published online by Cambridge University Press:
    26 July 2009, pp. 560-561
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Breaking the Light Barrier: Overcoming Diffraction-Limited Microscopy

Abstract

  • Infrared and Raman Microscopy: Pushing the Limits of Spatial Resolution

  • T Tague
  • Published online by Cambridge University Press:
    26 July 2009, pp. 562-563
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Three Dimensional Super Resolution Fluorescence Imaging of Single Bacterial Cells by Stereo Photoactivated Localization Microscopy

  • J Tang, A Vaziri, J Akerboom, L Looger, C Shank
  • Published online by Cambridge University Press:
    26 July 2009, pp. 564-565
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Three-Dimensional Imaging in the Biological and Materials Sciences: Bridging Nano and Micron Scales

Abstract

  • Extending the Limits of Single Particle Reconstruction

  • S Ludtke, M Schmid, W Chiu
  • Published online by Cambridge University Press:
    26 July 2009, pp. 566-567
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Signal to Noise Ratio Mapping for Cryo-Electron Tomography

  • C Renken
  • Published online by Cambridge University Press:
    26 July 2009, pp. 568-569
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Accessing Subcellular Structural Information with Advanced Targeting and Sectioning Techniques

  • A Leis, A Rigort, W Baumeister, JM Plitzko
  • Published online by Cambridge University Press:
    26 July 2009, pp. 570-571
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • BF STEM Tomography for Improved 3D Imaging of Thick Biological Sections

  • A Sousa, M Hohmann-Marriott, A Azari, G Zhang, R Leapman
  • Published online by Cambridge University Press:
    26 July 2009, pp. 572-573
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Design Optimization for Cryo-Tomography and Single Particle Data Acquisition and Analysis

  • BL Armbruster, J Brink, R Danev, T Isabell, M Kawasaki, S Motoki, K Nagayama
  • Published online by Cambridge University Press:
    26 July 2009, pp. 574-575
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Page 22 of 47