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Tomography of Biological Materials using Focused Ion Beam Sectioning and Backscattered Electron Imaging

Published online by Cambridge University Press:  26 July 2009

DAM de Winter ,
CTWM Schneijdenberg ,
MN Lebbink ,
LHP Hekking ,
JA Post ,
B Lich ,
AJ Verkleij ,
MM Drury  and
BM Humbel
DAM de Winter
Affiliation:
Utrecht University,Netherlands
CTWM Schneijdenberg
Affiliation:
Utrecht University,Netherlands
MN Lebbink
Affiliation:
Utrecht University,Netherlands
LHP Hekking
Affiliation:
Utrecht University,Netherlands
JA Post
Affiliation:
Utrecht University,Netherlands
B Lich
Affiliation:
FEI Company,Netherlands
AJ Verkleij
Affiliation:
Utrecht University,Netherlands
MM Drury
Affiliation:
Utrecht University,Netherlands
BM Humbel
Affiliation:
Utrecht University,Netherlands

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Information
Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 576 - 577
Copyright
Copyright © Microscopy Society of America 2009