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Transitioning Laser Ablation ICP-MS from Research Applications to Routine Trace Element Microanalysis: A Look at Quantitative Trace Element Analyses and Imaging

Published online by Cambridge University Press:  26 July 2009

AE Koenig
AE Koenig*
Affiliation:
United States Geological Survey

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Information
Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 536 - 537
Copyright
Copyright © Microscopy Society of America 2009