Microscopy and Microanalysis: Volume 24 - Proceedings of Microscopy & Microanalysis 2018

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2018

Analytical and Instrumentation Science Symposia

Atomic-scale Functional Imaging in Aberration-corrected Electron Microscopy

Abstract

Substrate Surface Roughness-Induced Antiphase Boundaries and Strain Relaxation in Cufe2o4 Films on Mgal2o4 (001) Substrates

Structural and Magnetic Properties of Nanosized LiCoO2 Surfaces

Four-dimensional Scanning Transmission Electron Microscopy (4D-STEM): From Scanning Nanodiffraction to Ptychography and Beyond

Abstract

A Next Generation Electron Microscopy Detector Aimed at Enabling New Scanning Diffraction Techniques and Online Data Reconstruction

Correlation of Strain and Elemental Distribution at the Interface Using Simultaneous Energy-Filtered High-Speed 4D STEM Diffraction Imaging and EDS

Thick (3D) Sample Imaging Using iDPC-STEM at Atomic Scale

Scanning Convergent Beam Electron Diffraction (CBED), the Essential Questions of Why, What and How?

Tuning STEM: Tailoring the Incident Probe, Scattering Dynamics and Detector Geometry for Maximum Specimen Information

Mapping Polarity, Toroidal Order, and the Local Energy Landscape by 4D-STEM

Three-Dimensional Polarization by Means of Scanning HOLZ-CBED Technique

Imaging Structure and Magnetisation in New Ways Using 4D STEM

Scanning Electron Diffraction – Crystal Mapping at the Nanoscale

Insights into Texture and Phase Coexistence in Polycrystalline and Polyphasic Ferroelectric HfO2 Thin Films using 4D-STEM

Low Dose Defocused Probe Electron Ptychography Using a Fast Direct Electron Detector

Sample Thickness Limitations in Defocused Electron Probe Ptychography

Exploring the Limits of Focused-Probe STEM Ptychography

Breaking the Rayleigh Limit in Thick Samples with Multi-slice Ptychography

Real-space Demonstration of 0.4 Angstrom Resolution at 80 keV via Electron Ptychography with a High Dynamic Range Pixel Array Detector

High Dose Efficiency Atomic Resolution Phase Imaging with Electron Ptychography

Low Dose Imaging by STEM Ptychography Using Pixelated STEM Detector

Demonstration of STEM Holography Using Diffraction Gratings

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2018

Analytical and Instrumentation Science Symposia

Atomic-scale Functional Imaging in Aberration-corrected Electron Microscopy

Abstract

Four-dimensional Scanning Transmission Electron Microscopy (4D-STEM): From Scanning Nanodiffraction to Ptychography and Beyond

Abstract