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Low Dose Imaging by STEM Ptychography Using Pixelated STEM Detector

Published online by Cambridge University Press:  01 August 2018

Ryusuke Sagawa ,
Hiroki Hashiguchi ,
Thomas Isabell ,
Robert Ritz ,
Martin Simson ,
Martin Huth ,
Heike Soltau ,
Gerardo T. Martinez ,
Peter D. Nellist  and
Yukihito Kondo
Ryusuke Sagawa
Affiliation:
EM Business Unit, JEOL Ltd., Tokyo, Japan
Hiroki Hashiguchi
Affiliation:
EM Business Unit, JEOL Ltd., Tokyo, Japan
Thomas Isabell
Affiliation:
JEOL USA Inc., Boston, USA
Robert Ritz
Affiliation:
Department of Materials, University of Oxford, Oxford, UK
Martin Simson
Affiliation:
Department of Materials, University of Oxford, Oxford, UK
Martin Huth
Affiliation:
Department of Materials, University of Oxford, Oxford, UK
Heike Soltau
Affiliation:
Department of Materials, University of Oxford, Oxford, UK
Gerardo T. Martinez
Affiliation:
PNDetector GmbH, Munchen, Germany
Peter D. Nellist
Affiliation:
PNDetector GmbH, Munchen, Germany
Yukihito Kondo
Affiliation:
EM Business Unit, JEOL Ltd., Tokyo, Japan

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 198 - 199
Copyright
© Microscopy Society of America 2018 

References

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