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Tuning STEM: Tailoring the Incident Probe, Scattering Dynamics and Detector Geometry for Maximum Specimen Information

  • J. Etheridge (a1) (a2), W. Chao (a2), E. Drath Bøjesen (a1), Y. Guo (a2), M. Krajnak (a2), W. Li (a2) and C. L. Zheng (a1)...
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Abstract

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References

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[1] Uchida, M. Tonomura, A. Nature 464 2010) p. 737.
[2] Verbeeck, J., Tian, H. Schattschneider, P. Nature 467 2010) p. 301.
[3] McMorran, B. J., et al, Science 331 2011) p. 192.
[4] Zheng, C. L., Petersen, T. C., Kirmse, H., Neumann, W., Morgan, M. F. Etheridge, J. Phys Rev Lett 119 2017 174801.
[5] Nakashima, P. H., Moodie, A. F. Etheridge, J. PNAS 110 2013) p. 14144.
[6] Nguyen, D. T., Findlay, S. D. Etheridge, J. Ultramicroscopy 184 2018) p. 143.
[7] Tate, M. W., et al, Microscopy and Microanalysis 22 2016) p. 237.
[8] The authors acknowledge funding from the Australian Research Council grants DP150104483, DP160104679 and LE0454166.

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