Hostname: page-component-76fb5796d-zzh7m Total loading time: 0 Render date: 2024-04-25T07:18:37.704Z Has data issue: false hasContentIssue false

Thick (3D) Sample Imaging Using iDPC-STEM at Atomic Scale

Published online by Cambridge University Press:  01 August 2018

Ivan Lazić
Affiliation:
Thermo Fisher Scientific, Materials & Structural Analysis, Eindhoven, The Netherlands
Eric G.T. Bosch
Affiliation:
Thermo Fisher Scientific, Materials & Structural Analysis, Eindhoven, The Netherlands
Emrah Yucelen
Affiliation:
Thermo Fisher Scientific, Materials & Structural Analysis, Eindhoven, The Netherlands
Robert Imlau
Affiliation:
Thermo Fisher Scientific, Materials & Structural Analysis, Eindhoven, The Netherlands
Lazar Sorin
Affiliation:
Thermo Fisher Scientific, Materials & Structural Analysis, Eindhoven, The Netherlands

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Copyright
© Microscopy Society of America 2018 

References

[1] Bosch, E. G. T. Lazic, I. Ultramicroscopy 156 2015) p. 59.Google Scholar
[2] Lazic, I., Bosch, E. G. T. Lazar, S. Ultramicroscopy 160 2016) p. 265.Google Scholar
[3] Lazic, I. Bosch, E.G.T. Advances in Imaging and Electron Physics 199 2017) p. 75.Google Scholar
[4] Yucelen, E., Lazic, I. Bosch, E. G. T. Scientific Reports 8 2018) p. 2676.Google Scholar
[5] Behan, G., et al, Phil. Trans. R. Soc. A 367 2009) p. 3825.Google Scholar
[6] Saito, G., et al, Ultramicroscopy 175 2017) p. 97.Google Scholar
[7] Einspahr, J. J. Voyles, P. M. Ultramicroscopy 106 2006) p. 1041.Google Scholar