Hostname: page-component-76fb5796d-45l2p Total loading time: 0 Render date: 2024-04-25T09:49:08.050Z Has data issue: false hasContentIssue false
  • English
  • Français

Correlation of Strain and Elemental Distribution at the Interface Using Simultaneous Energy-Filtered High-Speed 4D STEM Diffraction Imaging and EDS

Published online by Cambridge University Press:  01 August 2018

Anahita Pakzad  and
Paolo Longo
Anahita Pakzad
Affiliation:
Gatan Inc., Pleasanton, CA, USA
Paolo Longo
Affiliation:
Gatan Inc., Pleasanton, CA, USA

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 168 - 169
Copyright
© Microscopy Society of America 2018 

References

[1] We would like to thank Dr. Gianluigi Botton from McMaster University for providing the sample and helpful discussions on this work.Google Scholar