Microscopy and Microanalysis: Volume 24 - Proceedings of Microscopy & Microanalysis 2018

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2018

Analytical and Instrumentation Science Symposia

Atomic-scale Functional Imaging in Aberration-corrected Electron Microscopy

Abstract

Low Dose Imaging Using Simultaneous iDPC- and ADF-STEM for Beam Sensitive Crystalline Structures

Enhanced Environmental Design for a New Integrated Hyper-Modal Microscope

Real Time Acquisition and Calibration of S/TEM Probe Current Measurement Simultaneously with Any Imaging or Spectroscopic Signal

Atomic Resolution Imaging and Analysis of Graphene at Low Acceleration Voltages using Aberration Corrected Microscope with Cold Field Emission Gun

Atomic Scale Analyses of Planar Defects in Cross-section Nanorods of K+ Stabilized a-MnO2

STEM SI Warp: A Tool for Correcting the Linear and Nonlinear Distortions for Atomically Resolved STEM Spectrum and Diffraction Imaging

Carbon Based Nanohybrid Materials (sp2-sp3) for Energy Applications

Correlative Characterization of Defect Clusters in GaAs Solar Cells by High-Resolution TEM and Spatially Resolved Optical Techniques

Effective Reinforcement of Carbon-Carbon Composites Using Morped Graphene

HAADF-STEM Investigation of III-V Semiconductors Grown on Nanopatterned Si(001) Substrates

Interface Engineering of ZnS/GaP Multilayer Films: Understanding the Origins of High Visible-Light Photoactivity

Interpreting Cation Displacements and Image Motifs Associated with the Oxygen Exchange Reaction on CeO2 Nanoparticles

B-site Cation Ordering in BaaMnNbiO by Atomic Resolution HAADF-STEM and Their Valence State by EELS

Microstructure Study of Carbon Nanocages Consisting of Graphene Oxide Grafted with Single Gold Nanoparticles by Application of HAADF Contrast Imaging

Sample preparation for aberration-corrected microscopy of high-quality TEM specimens of advanced integrated circuits

Spherical Aberration Correction for SEMs with Electrostatic-type Compact Cs-corrector

Sunlight Active Perovskites (TiCh-CoTiCb) with Effective Dye Degradation and Water Splitting

The Morphology of TiiAlC (M2AX) and TiiC (MXene) Sheets Revealed by HAADF STEM Analysis

Towards Atomic-Scale Fabrication in Silicon

The Effect of Epitaxial Strain on Phase Stability in Double-Perovskite La2NiMnO6 Films

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2018

Analytical and Instrumentation Science Symposia

Atomic-scale Functional Imaging in Aberration-corrected Electron Microscopy

Abstract