Hostname: page-component-8448b6f56d-gtxcr Total loading time: 0 Render date: 2024-04-25T05:43:50.779Z Has data issue: false hasContentIssue false
  • English
  • Français

Interface Engineering of ZnS/GaP Multilayer Films: Understanding the Origins of High Visible-Light Photoactivity

Published online by Cambridge University Press:  01 August 2018

P.S.M. Gharavi ,
L. Xie ,
C.K.Y. Park ,
Y.H. Ng ,
J.Q. He ,
J. N. Hart  and
N. Valanoor
P.S.M. Gharavi
Affiliation:
School of Materials Science and Engineering, University of New South Wales (UNSW) Sydney, NSW, 2052, Australia Pico Electron Microscopy Center, Department of Physics, Southern University of Science and Technology (SUSTech), Shenzhen 518055, China
L. Xie
Affiliation:
Pico Electron Microscopy Center, Department of Physics, Southern University of Science and Technology (SUSTech), Shenzhen 518055, China
C.K.Y. Park
Affiliation:
School of Materials Science and Engineering, University of New South Wales (UNSW) Sydney, NSW, 2052, Australia
Y.H. Ng
Affiliation:
School of Chemical Engineering, University of New South Wales (UNSW) Sydney, NSW 2052, Australia
J.Q. He
Affiliation:
Pico Electron Microscopy Center, Department of Physics, Southern University of Science and Technology (SUSTech), Shenzhen 518055, China
J. N. Hart
Affiliation:
School of Materials Science and Engineering, University of New South Wales (UNSW) Sydney, NSW, 2052, Australia
N. Valanoor
Affiliation:
School of Materials Science and Engineering, University of New South Wales (UNSW) Sydney, NSW, 2052, Australia

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 142 - 143
Copyright
© Microscopy Society of America 2018 

References

[1]. Hart, J. Allan, N. Advanced Materials 25 2013) p. 2989–2993.Google Scholar
[2]. Park, K., Lee, J.A., Im, H.S., Jung, C.S., Kim, H.S., Park, J. Lee, C.L. ACS Nano Letters 14 2014) p. 5912–5919.Google Scholar
[3] The author thanks Professor J.Q. He and Dr. L. Xie in “Pico Electron Microscopy Center” of Southern University of Science and Technology (SUSTech) of China for access and technical support.Google Scholar