LeBeau, JM
2008) pp. 1653–1658.
 Jones, L
IOP Conference Series: Materials Science and Engineering 109
2016) p 012008.
 Watanabe, M
Journal of Microscopy 221
2006) pp. 89–109.
 Chen, Z, et at, Ultramicroscopy 157
2015) pp 21–26.
 Leapman, R
EELS Quantitative Analysis, in: Transmission Electron Energy Loss Spectrometry in Materials Science and The EELS Atlas (ed CC Ahn
 Xin, HL, et al, Ultramicroscopy 139
2014) pp. 38–46.
 Mitchell, DRG
Microscopy Research and Technique 78
2015) pp. 886–893.
 This work was supported by NSF DMREF through contract No CHE-1534630, Hitachi High-Technologies Corp., and the ETEM Catalysis Consortium (ECC, funded through U.Pitt). The authors would like to acknowledge the usage of the STEM at the Georgia Institute of Technology, as well as R.D. Twesten (Gatan) for information about the Digiscan hardware..