Microscopy and Microanalysis: Volume 22 -

View selected items
Save to my bookmarks
Export citations
Download PDF (zip)
Save to Kindle
Save to Dropbox
Save to Google Drive
Save content to
To save this undefined to your undefined account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you used this feature, you will be asked to authorise Cambridge Core to connect with your undefined account. Find out more about saving content to .

To save this article to your Kindle, first ensure coreplatform@cambridge.org is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about saving to your Kindle.

Note you can select to save to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be saved to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Please be advised that item(s) you selected are not available.
You are about to save
Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
Your Kindle email address

Please provide your Kindle email.

@free.kindle.com @kindle.com (service fees apply)

By using this service, you agree that you will only keep content for personal use, and will not openly distribute them via Dropbox, Google Drive or other file sharing services

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Volume 22 - February 2016

Analytical and Instrumentation Science Symposia

Advances in Image Processing, Display and Analysis

Abstract

Studying the Atomic Structures by Aberration-Corrected and Conventional Electron Microscopy

A Precise Description of Inorganic Nanoparticles in HRTEM Micrographs

Unambiguous Detections of The Plane Symmetries That Noisy Experimental Images from Naturally Formed 2D Periodic Arrays of Physical Objects Most Likely Possess

Advances in Mapping Periodic Structural Modulations of Atomic Lattices

Dictionary-based Filling of the Missing Wedge in Electron Tomography

An “Extra Dimension” in Electron Tomography: Automatic Parameter Determination for Next-generation Reconstruction Methods

Practical Implementation of Compressive Sensing for High Resolution STEM

Compressive STEM-EELS

Noise Removal by Crystallographic Averaging and Information Content of an Image With Respect to Detections of Plane Symmetries

Landyne - a Software Suite for Electron Diffraction Simulation and Analysis

MIPAR™: 2D and 3D Image Analysis Software Designed for Materials Scientists, by Materials Scientists

Silver Nanowire Diameter and Yield Characterization by High-Throughput SEM and Image Analysis

Image Processing and Analysis for Characterization of Patterns in Polystyrene Foam.

An Evaluation of Image Quality Metrics for Scanning Electron Microscopy

Advances in Scanning Electron/Ion Instrumentation and Detectors

Abstract

Multi-Beam Scanning Electron Microscope Design

Selective Detection of Backscattered Electrons in the Compound Lens Equipped UHR SEM

Design of an Ultra-High Resolution SEM for Enhanced Analysis

Miniature Electron Beam Columns: From the Lab to the Field

Imaging a 1 mm3Volume of Rat Cortex Using a MultiBeam SEM

Multi-beam Electron Microscopy: Principles and Applications

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Save Search

Volume 22 - February 2016

Analytical and Instrumentation Science Symposia

Advances in Image Processing, Display and Analysis

Abstract

Advances in Scanning Electron/Ion Instrumentation and Detectors

Abstract