Microscopy and Microanalysis: Volume 22 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

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Microscopy and Microanalysis

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Volume 22 - February 2016

Analytical and Instrumentation Science Symposia

Advanced Scanning Diffraction: Mapping Functionality in Reciprocal Space at Nanometer Resolution

Abstract

The Use of Electron Ptychography to Implement Efficient Phase Imaging in STEM

Mapping Of Nanoscale Structural Fluctuations In Ferroelectric BaTiO3Using STEM-CBED

Revealing Point Defects in a Large-Scale Scanning Diffraction Dataset

Reconstruction of Polarization Vortices by Diffraction Mapping of Ferroelectric PbTiO3 / SrTiO3 Superlattice Using a High Dynamic Range Pixelated Detector

Facilitating Quantitative Analysis of Atomic Scale 4D STEM Datasets

Towards Mapping Perovskite Oxide 3-D Structure Using Two-Dimensional Pixelated STEM Detector

An Electron Microscope Pixel Array Detector as a Universal STEM Detector

STEM Phase Imaging by Annular Pixel Array Detector (A-PAD) Combined with Quasi-Bessel Beam

Multivariate Statistical Analysis of Series of Diffraction Patterns

Measurement of Atomic Electric Fields by Scanning Transmission Electron Microscopy (STEM) Employing Ultrafast Detectors

Fluctuation Electron Microscopy and Computational Structure Refinement for the Structure of Amorphous Materials

Radial Distribution Function Imaging by Diffraction Scanning Electron Microscopy

Effect of Medium Range Order on Crystallization Kinetics of CuxZr1-xThin Film Metallic Glasses

Development of Diffraction Scanning Techniques for Beam Sensitive Polymers.

Study of Structure of Li- and Mn-rich Transition Metal Oxides Using 4D-STEM

Solving Challenging Crystallographic Problems with Automated Electron Diffraction Tomography (ADT)

Three-Dimensional Nanostructure Determination Based On Scanning Electron Nanodiffraction

Crystal Orientation Angular Resolution with Precession Electron Diffraction

Quantitative Structural Analysis of Complex Materials by Scanning Nanobeam Diffraction

Quantitative Atomic Resolution Differential Phase Contrast Imaging Using a Segmented Area All Field Detector

Microscopy and Microanalysis

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Volume 22 - February 2016

Analytical and Instrumentation Science Symposia

Advanced Scanning Diffraction: Mapping Functionality in Reciprocal Space at Nanometer Resolution

Abstract