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Revealing Point Defects in a Large-Scale Scanning Diffraction Dataset

Published online by Cambridge University Press:  25 July 2016

R. dos Reis
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, LBNL, Berkeley, CA, USA
C. Ophus
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, LBNL, Berkeley, CA, USA
J. Ciston
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, LBNL, Berkeley, CA, USA
P. Ercius
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, LBNL, Berkeley, CA, USA
U. Dahmen
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, LBNL, Berkeley, CA, USA

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2016 

References

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[3] dos Reis, R., Ophus, C., Ciston, J., Ercius, P. & Dahmen, U. Microsc Microanal 21, 1097 (2015).Google Scholar
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[5] Kirkland, E. J. Advanced Computing in Electron Microscopy. Springer US, Boston, MA (2010).Google Scholar
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[7] Work at the NCEM/Molecular Foundry was supported by the Office of Science, Office of Basic Energy Sciences, of the U.S. Department of Energy under Contract No. DE-AC02-05CH11231. RR acknowledges the support of CAPES/BR Foundation Process No. 1204713-9.Google Scholar