Microscopy and Microanalysis: Volume 22 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

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Microscopy and Microanalysis

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Volume 22 - February 2016

Analytical and Instrumentation Science Symposia

Surface and Subsurface Microscopy and Analysis

Abstract

Characterization of Protein G B1 Immobilized Gold Nanoparticles using Time of Flight Secondary Ion Mass Spectrometry and X-ray Photoelectron Spectroscopy

A Revolutionary Approach for Molecular Imaging with TOF-SIMS Parallel Imaging MS/MS

Sub-Micron Resolution Imaging with Bio-Molecular Identification by TOF-SIMS Parallel Imaging MS/MS

Imaging in Liquids through Ultra-thin Membranes: A Comparative Analysis of Scanning Electron and Scanning Microwave Microscopies

Atomic Force Microscopy of Polymer Systems: From Morphology to Properties to Chemical Imaging and Spectroscopy

Surface Modifications during a Catalytic Reaction: a Combined APT and FIB/SEM Analysis of Surface Segregation

A Review of Recent Developments in Low Energy Ion Scattering (LEIS) and Its Applications

Atomic Surface Structures of Oxide Nanoparticles with Well-defined Shapes

High Reproducible Scanning Near-field Optical Microscopy with a Few Nanometer Lateral Spatial Resolution

Electronic Behaviors of Individual Defects and Boundaries in 2D Materials: A Spatially Resolved Study with Multi-Probe Scanning Tunneling Microscopy

Surface Phonon Coupling within Boron Nitride Nanotubes Resolved by a Novel Near-Field Infrared Pump-Probe Imaging Technique.

Submicron Spatial Resolution in Thermal Desorption Mass Spectrometry via Rapid Heating Functions using Thermal AFM Probes

Making Light Work: Enhancing Surface and Thin Film Analysis through In-Situ Complementary Spectroscopies

High Speed, Large Scan Area, Distortion Free Operation of a Single-Chip Scanning Probe Microscope

Innovative Applications of Raman Microscopy

Full information acquisition and analysis of reflection high energy electron diffraction data for epitaxial growth processes

Field Ion Microscopy and Pulsed Field Desorption Mass Spectrometry: Unique Tools for Surface and Subsurface Analysis

XPS Spectromicroscopy as an Optimised Technique for Materials Characterisation.

Observation of Moiré-like Fringes in HAADF-STEM Images of Heterostructures of Two-dimensional Materials

Differentiation of Surface and Bulk Conductivities via Four-probe Spectroscopy

Microscopy and Microanalysis

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Volume 22 - February 2016

Analytical and Instrumentation Science Symposia

Surface and Subsurface Microscopy and Analysis

Abstract