Microscopy and Microanalysis: Volume 22 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 22 - February 2016

Analytical and Instrumentation Science Symposia

Quantitative and Qualitative Microanalysis by EPMA and SEM

Abstract

EPMA WDS Peak Position Analysis of Mineral Chemistry in Fossils

Evaluation of MPI-DING Glasses for Use as Electron Probe Standards.

Iron Speciation Microanalysis: Evaluating Low Overvoltage Wavelength Dispersive Spectrometry Using Natural Reference Materials

The Investigation of Chemical Shift of Silicon X-ray Energy in Different Stoichiometry or Structure with Microcalorimeter EDS

Oxidation State Determination from Chemical Shift Measurements using a Cryogen-Free Microcalorimeter X-Ray Spectrometer on an SEM

Standardless Quantification at Trace Elemental (PPM) Levels Using a Novel Attachment within an Electron Microscope and Microprobe

Combined EDX and Micro XRF Analysis on SEMs

Low Voltage X-ray Mapping: The Complementary Methods of the Oxford Instruments X-Max Extreme Windowless EDS Detector and the JEOL Soft X-Ray Emission Spectroscopy (SXES)

Pushing the XEDS Boundaries in Materials Research: Low Voltage XED Spectrum Imaging in the FEG-SEM

Comparing the Intensities and Spectral Resolution Achieved by Wavelength-Dispersive Spectrometers on Microprobes and SEMs.

SEM/EDS-Assisted LAM-ICPMS Analyses of Tourmaline of Tourmalinites Hosted in Serpentinites of the Paso Del Dragón Complex, Northeastern Uruguay

Development of a Reference Material for Image Sharpness Evaluation in Scanning Electron Microscopy

Introducing a New NIST Reference Material: Multiwall Carbon Nanotube Soot

Electrospun CeO2-ZnO Nanofibers Analyzed by Electron Probe Microanalyzer

Drainage Integration of the Salt and Verde Rivers in Arizona: Initial Insight from an Electron Microprobe Investigation of Basalts

Use of a Laser Engraver in Relocations and Sample Preparation for SEM and Light Microscope Analysis.

A SXES and CL Spectral Library for the Analysis of Rare Earth Elements

Advanced Scanning Diffraction: Mapping Functionality in Reciprocal Space at Nanometer Resolution

Abstract

Phase Contrast Imaging of Weakly-Scattering Samples with Matched Illumination and Detector Interferometry–Scanning Transmission Electron Microscopy (MIDI–STEM)

Enhanced Phase Contrast Transfer using Ptychography Combined with a Pre-Specimen Phase Plate in a Scanning Transmission Electron Microscope

Towards 3D electron ptychographic reconstruction

Microscopy and Microanalysis

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Volume 22 - February 2016

Analytical and Instrumentation Science Symposia

Quantitative and Qualitative Microanalysis by EPMA and SEM

Abstract

Advanced Scanning Diffraction: Mapping Functionality in Reciprocal Space at Nanometer Resolution

Abstract