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Standardless Quantification at Trace Elemental (PPM) Levels Using a Novel Attachment within an Electron Microscope and Microprobe
Published online by Cambridge University Press: 25 July 2016
Abstract
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- Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 436 - 437
- Copyright
- © Microscopy Society of America 2016
References
References:
[3] Acknowledgments go to the NSF, Division of Industrial Innovation & Partnerships for funding the development of x-ray mirror lens (IIP-1448727) and to the NIH, National Institute of General Medicine Science for funding the development of the microstructured source target (GRANT11545218).Google Scholar