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Low Voltage X-ray Mapping: The Complementary Methods of the Oxford Instruments X-Max Extreme Windowless EDS Detector and the JEOL Soft X-Ray Emission Spectroscopy (SXES)

Published online by Cambridge University Press:  25 July 2016

G. McMahon ,
S. Burgess ,
M. Takakura ,
H. Takahashi  and
M.G. Burke
G. McMahon
Affiliation:
Materials Performance Centre and Electron Microscopy Centre, University of Manchester, ManchesterUK
S. Burgess
Affiliation:
Oxford Instruments NanoAnalysis, High WycombeUK
M. Takakura
Affiliation:
JEOL, SA Business Unit, JEOL Ltd., Akishima TokyoJapan
H. Takahashi
Affiliation:
JEOL, SA Business Unit, JEOL Ltd., Akishima TokyoJapan
M.G. Burke
Affiliation:
Materials Performance Centre and Electron Microscopy Centre, University of Manchester, ManchesterUK

Abstract

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Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 440 - 441
Copyright
© Microscopy Society of America 2016