Microscopy and Microanalysis: Volume 22 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 22 - February 2016

Analytical and Instrumentation Science Symposia

Analytical Electron Microscopy for Advanced Characterization from Multi-Dimensional Data Acquisition to Integrated Analysis

Abstract

Integrated Differential Phase Contrast (iDPC) STEM: A New Atomic Resolution STEM Technique To Image All Elements Across the Periodic Table

Linking Dopant Distribution and Interatomic Distortions at La1.6Mo.4CuO4/La2CuO4 Superconducting Interfaces

Improvement of Imaging Performance with a New ASCOR Probe-Corrector in a 200 kV JEM-ARM200CF

Initial Results From a CdTe High-Energy X-ray Detector on a TEM

Atomic-resolution EELS Study of Polarization of BaTiO3in the Interface With Metallic Manganite

Effective Method for Decreasing Detection Limit of Dopant Concentration in Semiconductor Using Dual SDD Analysis System

Ultrahighly Efficient X-ray Detection System Of Two Very Large Sized SDDs for Aberration Corrected 300 kV Microscope

Study of Strain and Intermixing at the BaSnO3/SrTiO3and BaSnO3/LaAlO3Interfaces Using STEM and EELS

A Ge/SiNx Standard for Evaluating the Performance of X-ray Detectors in the SEM, S/TEM and AEM

Aberration-corrected Scanning Transmission Electron Microscopy and Spectroscopy of Nonprecious Metal Nanoparticles in Titania Aerogels

The Combination of STEM Tomography and STEM/EDS Analysis of NiSi Formation Related Defects in Semiconductor Wafer-foundries

Beyond Electrochemical Analysis: 2D to 4D Correlation of Structure and Chemistry in Li-ion Batteries

A Challenge to Multivariate Statistical Analysis: Spent Nuclear Fuel

Characterization of Palladium and Gold Nanoparticles on Granular Activated Carbon as an Efficient Catalyst for Hydrodechlorination of Trichloroethylene

Minimize Electron Beam Damage during Characterization of Carbon-Depletion in Ultra Low-K Dielectric Materials by STEM EELS Elemental Mapping

Performance of a Direct Electron Detector for the Application of Electron Energy-Loss Spectroscopy

Simple and Compact Electrostatic Cs-Corrector using Annular and Circular Electrodes

Surface and Subsurface Microscopy and Analysis

Abstract

A Novel Hybrid Dual Analyzer SIMS Instrument for Improved Surface and 3D-Analysis

Complementing Secondary Ion Mass Spectrometry with other Ion-, Electron-and Photon-based Analytical Microscopies

New Data Analysis Tools for X-ray Photoelectron Spectroscopy (XPS) and Spectroscopic Ellipsometry (SE): Uniqueness Plots and Width Functions in XPS, and Distance, Principal Component, and Cluster Analyses in SE

Microscopy and Microanalysis

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Volume 22 - February 2016

Analytical and Instrumentation Science Symposia

Analytical Electron Microscopy for Advanced Characterization from Multi-Dimensional Data Acquisition to Integrated Analysis

Abstract

Surface and Subsurface Microscopy and Analysis

Abstract