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A Ge/SiNx Standard for Evaluating the Performance of X-ray Detectors in the SEM, S/TEM and AEM

Published online by Cambridge University Press:  25 July 2016

Nestor J. Zaluzec ,
Jon-Paul DesOrmeaux  and
James Roussie
Nestor J. Zaluzec
Affiliation:
Electron Microscopy Center, Center for Nanoscale Materials, Argonne National Laboratory, Argonne, IL, USA
Jon-Paul DesOrmeaux
Affiliation:
TEMwindows /SiMPore Inc, West Henrietta NYUSA
James Roussie
Affiliation:
TEMwindows /SiMPore Inc, West Henrietta NYUSA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 322 - 323
Copyright
© Microscopy Society of America 2016 

References

References:

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[2] Schamberg, F. Microsc. Microanal (2015) 21(S3), 1479.Google Scholar
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[4] Slater, T., et al, Ultramicroscopy (2016) 162, 61.Google Scholar
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[7] Research supported in part by U.S. DoE, Office of Science, Contract No. DE-AC02-06CH11357 in the Electron Microscopy Center of the Center for Nanoscale Materials at Argonne National Laboratory.Google Scholar