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Integrated Differential Phase Contrast (iDPC) STEM: A New Atomic Resolution STEM Technique To Image All Elements Across the Periodic Table

Published online by Cambridge University Press:  25 July 2016

Eric G.T. Bosch ,
Ivan Lazic  and
Sorin Lazar
Eric G.T. Bosch
Affiliation:
FEI Electron Optics, Achtseweg Noord 5, 5651 GG Eindhoven, the Netherlands
Ivan Lazic
Affiliation:
FEI Electron Optics, Achtseweg Noord 5, 5651 GG Eindhoven, the Netherlands
Sorin Lazar
Affiliation:
FEI Electron Optics, Achtseweg Noord 5, 5651 GG Eindhoven, the Netherlands

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 306 - 307
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Lazić, I., Bosch, E.G.T. & Lazar, S. Ultramicroscopy 160 (2016) 265–280.Google Scholar
[2] Bosch, E.G.T. & Lazic, I. Ultramicroscopy 156 (2015) 59–72.Google Scholar
[3] Kirkland, E.J. Advanced Computing in Electron Microscopy. Springer, New York (2010) 253–260.Google Scholar