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Surface and Nano Analysis Research Group, Research Institute for Material and Chemical Measurement, National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Japan
Akira Kurokawa
Affiliation:
Surface and Nano Analysis Research Group, Research Institute for Material and Chemical Measurement, National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Japan
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[3] A part of this study was conducted as one of the activities in Japan Industrial Technology Association supported by JKA Foundation (FY2015).Google Scholar