Hostname: page-component-77c89778f8-gvh9x Total loading time: 0 Render date: 2024-07-18T23:29:45.186Z Has data issue: false hasContentIssue false
  • English
  • Français

Studying the Atomic Structures by Aberration-Corrected and Conventional Electron Microscopy

Published online by Cambridge University Press:  25 July 2016

Y. M. Wang
Y. M. Wang*
Affiliation:
Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing, China

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 546 - 547
Copyright
© Microscopy Society of America 2016 

References

[1] Haider, M., Braunshausen, G. & Schwan, E. Optik 99 (1995). p. 167.Google Scholar
[2] Li, F.H. Phys Status Solidi A 207 (2010). p. 2639.Google Scholar
[3] De Caro, L., et al, Nat. Nano 5 (2010). p. 36.Google Scholar
[4] Wan, W., Hovmöller, S. & Zou, X.D. Ultramicroscopy 115 (2012). p. 60.CrossRefGoogle Scholar
[5] OpdeBeeck, M. & VanDyck, D. Ultramicroscopy 64 (1996). p. 153.Google Scholar
[6] Chen, J.H., Zandbergen, H.W. & VanDyck, D. Ultramicroscopy 98 (2004). p. 81.CrossRefGoogle Scholar
[7] Jia, C.L., Lentzen, M. & Urban, K. Science 299 (2003). p. 870.Google Scholar
[8] Sun, Y., et al, Nat. Commun 4 (2013). p. 1870.Google Scholar
[9] Shao-Horn, Y., et al, Nat. Mater 2 (2003). p. 464.Google Scholar
[10] Wang, H.B., et al, Acta Cryst. A 58 (2002). p. 494.Google Scholar
[11] Wang, Y.M., Ge, B. H. & Che, G. Micron 71 (2015). p. 32.Google Scholar
[12] Tian, L., et al, APL 106 (2015). p. 112903.Google Scholar
[13] The author acknowledge funding from the National Natural Science Foundation of China (Grant No. 11474329).Google Scholar