Hostname: page-component-77c89778f8-gvh9x Total loading time: 0 Render date: 2024-07-18T23:40:00.287Z Has data issue: false hasContentIssue false

Miniature Electron Beam Columns: From the Lab to the Field

Published online by Cambridge University Press:  25 July 2016

Lawrence Muray
Affiliation:
Keysight Technologies, Inc. Nano Scale Sciences Division , Santa Clara, CA, USA
Scott Davilla
Affiliation:
Keysight Technologies, Inc. Nano Scale Sciences Division, Santa Clara, CA, USA
James Spallas
Affiliation:
Keysight Technologies, Inc. Nano Scale Sciences Division, Santa Clara, CA, USA

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Copyright
© Microscopy Society of America 2016 

References

[1] Muray, L. Scanning 33, 155161, 2011.Google Scholar
[2] Linnarsson, D., Carpenter, J., Fubini, B., Gerde, P., Karlsson, L. L., Loftus, D. J., Prisk, G. K., Staufer, U., Tranfield, E. M. & Van Westrenen, W. Planet. Space Sci. vol. 74 no. 1, pp. 5771, 2012.Google Scholar
[3] Spallas, J., Silver, C., Muray, L., Wells, T. & El Gomati, M. Microelectron. Eng 83, 984989, 2006.Google Scholar
[4] Muray, L., Spallas, J. & Meisburger, D. Proc. SPIE 9236, Scanning Microscopies (2014).Google Scholar
[5] Wu, Y., Klyachko, D., Davilla, S., Spallas, J., Indermuehle, S. & Muray, L. J. of Vac. Sci. & Technol. B 32 (2014).Google Scholar