Hostname: page-component-5c6d5d7d68-xq9c7 Total loading time: 0 Render date: 2024-08-18T16:33:14.944Z Has data issue: false hasContentIssue false
  • English
  • Français

An “Extra Dimension” in Electron Tomography: Automatic Parameter Determination for Next-generation Reconstruction Methods

Published online by Cambridge University Press:  25 July 2016

Yi Jiang ,
Nina Andrejevic ,
Elliot Padgett  and
David A. Muller
Yi Jiang
Affiliation:
Department of Physics, Cornell University, Ithaca, NY 14853
Nina Andrejevic
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY 14853
Elliot Padgett
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY 14853
David A. Muller
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY 14853 Kavli Institute at Cornell for Nanoscale Science, Ithaca, New York 14853

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 556 - 557
Copyright
© Microscopy Society of America 2016 

References

[1] Saghi, Z., etal, Nano letters 11 (2011). p. 4666–4673.Google Scholar
[2] Sidky, E., etal, Physics in medicine and biology 53 (2008). p. 4777–4807.Google Scholar
[3] Bian, J., et al, Physics in medicine and biology 59 (2014). p. 2659–2685.Google Scholar
[4] Hovden, R., et al, Microscopy and Microanalysis 21 (2015). p. 2407–2408.CrossRefGoogle Scholar
[5] Y. Jiang acknowledges funding from DOE grant DE-SC0005827.Google Scholar