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Volume 17 - February 2011

Contents

Page 31 of 58

Instrumentation and Techniques

Microanalysis Standards

Abstract

  • EPMA on Copper-Gold Alloys - A CCQM/SAWG Pilot Study

  • V-D Hodoroaba, R Marinenko, J Small, W Unger
  • Published online by Cambridge University Press:
    08 April 2017, pp. 856-857
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • MSA/MAS Hyper-Dimensional Spectral File Format - A Straw-Man Proposal

  • M Kundmann, N Wilson, A Torpy, N Zaluzec
  • Published online by Cambridge University Press:
    08 April 2017, pp. 860-861
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Applications of Thin-Film Standards in Analytical Electron Microscopy

  • M Watanabe
  • Published online by Cambridge University Press:
    08 April 2017, pp. 862-863
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Remote & Collaborative Instrument Operation for Research, Teaching and Maintenance

Abstract

  • Computer Integrated X-ray Systems and Intelligent Control Systems for Remote Microscopy and Power Savings

  • R Wuhrer, K Moran
  • Published online by Cambridge University Press:
    08 April 2017, pp. 866-867
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Practical Remote Electron Microscopy - A Vendor's Perspective

  • T Isabell, N Erdman, V Robertson, I Ishikawa, K Somehara, T Nakamichi
  • Published online by Cambridge University Press:
    09 April 2017, pp. 868-869
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Advanced Microscopic Characterisation through Integrated Learning Tools

  • B Cribb, T White, J Shapter, J Muhling, L Soon, S Ringer, E Grinan, C Frost, P Munroe
  • Published online by Cambridge University Press:
    09 April 2017, pp. 870-871
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • On-Line Scanned Probe Microscopy Transparently Integrated with Twin SEM/FIB Systems

  • A Lewis, A Ignatov, A Komissar, H Taha, E Maayan
  • Published online by Cambridge University Press:
    09 April 2017, pp. 872-873
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Remote Viewing of SEM - A Versatile Tool for Failure Analysts and the Materials Community

  • C Shah
  • Published online by Cambridge University Press:
    09 April 2017, pp. 874-875
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Optimizing Imaging for Microanalysis: Realizing the Benefits of the New Detector Options

Abstract

  • Secondary Electron Imaging - Doing it Better

  • D Joy, B Griffin
  • Published online by Cambridge University Press:
    08 April 2017, pp. 876-877
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Angle and Energy Selective Electron Imaging With an Immersion Lens Cryo-SEM

  • B Lich, J Greiser, F Morrissey, E Bosch, G Veen, L Roussel, L Tuma
  • Published online by Cambridge University Press:
    08 April 2017, pp. 878-879
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Energy Selective Secondary Electron Detection in SEM for the Characterization of Polymers

  • C Rodenburg, A Pearson, S Boden
  • Published online by Cambridge University Press:
    09 April 2017, pp. 880-881
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Focused Ion Beam Nano-Tomography Using Different Detectors

  • M Cantoni, P Burdet, G Knott, C Hébert
  • Published online by Cambridge University Press:
    09 April 2017, pp. 882-883
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Elemental Mapping with SDD-EDS: Solving the Hard Problems

  • D Newbury, N Ritchie
  • Published online by Cambridge University Press:
    08 April 2017, pp. 884-885
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • New Real Time Visualisations for X-ray Mapping Data

  • P Statham
  • Published online by Cambridge University Press:
    08 April 2017, pp. 886-887
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Spatial Resolution of X-Ray Images

  • R Gauvin, P Michaud
  • Published online by Cambridge University Press:
    09 April 2017, pp. 888-889
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • High Speed, High Resolution and Large Area X-ray Imaging Using Silicon Drift Detectors

  • R Terborg, J Berlin, T Salge
  • Published online by Cambridge University Press:
    09 April 2017, pp. 892-893
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • X-Ray Images with Silicon Drift Detectors

  • R Anderhalt, T Nylese
  • Published online by Cambridge University Press:
    08 April 2017, pp. 894-895
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Page 31 of 58