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High Speed, High Resolution and Large Area X-ray Imaging Using Silicon Drift Detectors

Published online by Cambridge University Press:  09 April 2017

R Terborg ,
J Berlin  and
T Salge
R Terborg
Affiliation:
Bruker Nano
J Berlin
Affiliation:
Bruker Nano
T Salge
Affiliation:
Bruker Nano

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 892 - 893
Copyright
Copyright © Microscopy Society of America 2011