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Angle and Energy Selective Electron Imaging With an Immersion Lens Cryo-SEM

Published online by Cambridge University Press:  08 April 2017

B Lich ,
J Greiser ,
F Morrissey ,
E Bosch ,
G Veen ,
L Roussel  and
L Tuma
B Lich
Affiliation:
FEI Company
J Greiser
Affiliation:
FEI Company
F Morrissey
Affiliation:
FEI Company
E Bosch
Affiliation:
FEI Company
G Veen
Affiliation:
FEI Company
L Roussel
Affiliation:
FEI Company
L Tuma
Affiliation:
FEI Company

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 878 - 879
Copyright
Copyright © Microscopy Society of America 2011