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Volume 17 - February 2011

Contents

Page 29 of 58

Instrumentation and Techniques

Advances in EELS and EFTEM

Abstract

  • EELS Studies of Extrinsic Multiferroics

  • B Warot-Fonrose, E Snoeck, G Delaizir, P Rozier, M Dollé, V Serin, J Bobo
  • Published online by Cambridge University Press:
    08 April 2017, pp. 776-777
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Electron Energy Loss Spectroscopy for Aqueous in Situ Scanning Transmission Electron Microscopy

  • K Jungjohann, J Evans, I Arslan, N Browning
  • Published online by Cambridge University Press:
    08 April 2017, pp. 778-779
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Energy-Loss Characteristics for EFTEM Imaging with a Liquid Flow Cell

  • K Klein, N de Jonge, I Anderson
  • Published online by Cambridge University Press:
    08 April 2017, pp. 780-781
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Analysis and Artifacts in EELS Spectrum Imaging

  • J Mundy, L Fitting Kourkoutis, H Xin, D Muller
  • Published online by Cambridge University Press:
    08 April 2017, pp. 782-783
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Multivariate Statistical Analysis Strategies of EELS Spectral Images

  • M Van Benthem, P Kotula, P Lu
  • Published online by Cambridge University Press:
    08 April 2017, pp. 784-785
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Applications of Atomic-Resolution EELS Mapping at Low kV

  • B Schaffer, F Azough, D Abou-Ras, S Schmidt, M Schaffer, M Sarahan, Q Ramasse, R Caballero
  • Published online by Cambridge University Press:
    08 April 2017, pp. 786-787
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • HAADF and EELS Combined Studies of a New Generation of Materials for Ni-MH Batteries

  • V Serin, C Magen, R Serra, M Ibarra, M Hÿtch, J Zhang, L Lemort, M Latroche, B Knosp, P Bernard
  • Published online by Cambridge University Press:
    08 April 2017, pp. 788-789
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Development of a New Acquisition Scheme for Energy-Filtering Transmission Electron Microscopy Spectrum-Imaging toward Quantification

  • M Watanabe, F Allen
  • Published online by Cambridge University Press:
    08 April 2017, pp. 790-791
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Cornell Spectrum Imager: Open Source Spectrum Analysis with ImageJ

  • P Cueva, R Hovden, D Muller
  • Published online by Cambridge University Press:
    08 April 2017, pp. 792-793
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • In-Situ Study of Nb Oxide Thin Films Using Electron Energy Loss Spectroscopy

  • R Tao, R Klie, A Romanenko, L Cooley
  • Published online by Cambridge University Press:
    08 April 2017, pp. 798-799
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Energy Loss Near-Edge Fine Structure of Oxygen K of Spinel NixMn3-xO4

  • J Li, S Ko, S Trolier-McKinstry, E Dickey
  • Published online by Cambridge University Press:
    09 April 2017, pp. 800-801
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Data Analysis Methods for Modern Analytical Electron Microscopy

  • M Walls, F de la Peña
  • Published online by Cambridge University Press:
    08 April 2017, pp. 802-803
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Observation of the Hole State Symmetry by Anisotropy of Inelastic Scattering Accompanied by Inner-Shell Excitation

  • K Saitoh, K Momonoi, N Tanaka
  • Published online by Cambridge University Press:
    08 April 2017, pp. 804-805
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Site-Specific Transition Metal 3d Electron Configurations Studied by Energy Loss with Channeled Electrons

  • K Tatsumi, S Muto, J Rusz
  • Published online by Cambridge University Press:
    08 April 2017, pp. 806-807
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Simulation of STEM-EELS Including Diffraction and Solid-State Effects I: Mixed Dynamic Form Factor beyond the Dipole Approximation

  • M Prange, M Oxley, S Pennycook, S Pantelides
  • Published online by Cambridge University Press:
    08 April 2017, pp. 808-809
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Simulation of STEM-EELS Including Diffraction and Solid-State Effects II: Adding the Experiment

  • M Oxley, M Prange, S Pennycook, S Pantelides
  • Published online by Cambridge University Press:
    08 April 2017, pp. 810-811
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Reciprocal Space Signals Arising from Interference of Core-Loss Electrons in the EMCD Geometry

  • K Leifer, S Rubino, J Rusz, H Lidbaum, B Hjörvarsson, P Oppeneer, O Eriksson
  • Published online by Cambridge University Press:
    08 April 2017, pp. 812-813
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • A New High Speed, High Resolution 2k x 2k CCD Camera for Transmission Electron Microscopes

  • Y Jia, B Mollon, P Mooney, M Pan, B McGinn, M Azimi, N Cabilan, A Gubbens, M Lent
  • Published online by Cambridge University Press:
    08 April 2017, pp. 814-815
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Page 29 of 58