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Volume 17 - February 2011

Contents

Page 28 of 58

Instrumentation and Techniques

Advancing Data Collection and Analysis for Atom Probe Tomography

Abstract

  • Transmission Electron Microscopy and Atom Probe Tomography Analysis of Rare-Earth Hexaboride Nanowires

  • D Diercks, C Cheung, J Brewer
  • Published online by Cambridge University Press:
    08 April 2017, pp. 736-737
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Non-Tangential Continuity Reconstruction in Atom Probe Tomography Data

  • D Larson, B Geiser, T Prosa, R Ulfig, T Kelly
  • Published online by Cambridge University Press:
    08 April 2017, pp. 740-741
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Analysis of Laser Influence on Field Enhancement and Heating of the Specimen in Pulsed Laser Atom Probe Tomography

  • X Chen, C Tourek, X Wang, S Sundararajan
  • Published online by Cambridge University Press:
    08 April 2017, pp. 742-743
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Kinetic-Energy Discrimination for Atom Probe Tomography: Concepts and Potential Detectors

  • T Kelly
  • Published online by Cambridge University Press:
    08 April 2017, pp. 746-747
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Characterization of the Chemistry and Structure of Material Transfer on AFM Tips Resulting from Contact and Sliding Experiments

  • C Tourek, S Sundararajan
  • Published online by Cambridge University Press:
    08 April 2017, pp. 748-749
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Atom Probe Tomography Analysis of Thick Film SiO2 and Oxide Interfaces: Conditions Leading to Improved Analysis Yield

  • T Prosa, D Lawrence, D Olson, D Lenz, J Bunton, D Larson
  • Published online by Cambridge University Press:
    08 April 2017, pp. 750-751
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Prospects for Atom Probe Tomography of Commercial Semiconductor Devices

  • D Larson, D Lawrence, D Olson, T Prosa, D Reinhard, R Ulfig, P Clifton, J Bunton, D Lenz, J Olson, L Renaud, I Martin, T Kelly
  • Published online by Cambridge University Press:
    08 April 2017, pp. 752-753
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • MeasuringContributions to Mass Resolving Power in Atom Probe Tomography

  • E Oltman, T Kelly, T Prosa, D Lawrence, D Larson
  • Published online by Cambridge University Press:
    08 April 2017, pp. 754-755
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • New Equipment for Correlative FIB/TEM/Atom Probe and Site-Specific Preparation Using STEM Live Imaging

  • P Felfer, J Cairney
  • Published online by Cambridge University Press:
    08 April 2017, pp. 756-757
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • TEM and Atom Probe Investigation of Calcium Carbonate Precipitation in Seawater

  • S McMurray, B Gorman, D Diercks
  • Published online by Cambridge University Press:
    08 April 2017, pp. 758-759
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Advances in EELS and EFTEM

Abstract

  • EELS and EFTEM of Surface Plasmons in Metallic Nanostructures

  • W Sigle, L Gu, N Talebi, B Ögüt, C Koch, R Vogelgesang, P van Aken
  • Published online by Cambridge University Press:
    08 April 2017, pp. 762-763
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Mapping of Electron-Beam-Excited Plasmon Modes in Lithographically-Defined Gold Nanostructures

  • A Koh, A Fernandez-Dominguez, S Maier, J Yang, D McComb
  • Published online by Cambridge University Press:
    09 April 2017, pp. 764-765
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Fabry-Perot Plasmonic Resonances in Silver Nanowire Antennas Imaged with a Sub-Nanometer Electron Probe

  • D Rossouw, M Couillard, J Vickery, E Kumacheva, G Botton
  • Published online by Cambridge University Press:
    08 April 2017, pp. 766-767
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Low-Loss Studies on Metallic and Insulating Nanostructures Using a Monochromatic Electron Beam

  • R Arenal
  • Published online by Cambridge University Press:
    08 April 2017, pp. 768-769
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Simulation of valence EELS and Optical Response Functions from First Principles

  • V Keast, R Burgess, D Walton
  • Published online by Cambridge University Press:
    08 April 2017, pp. 772-773
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Extrapolating the Valence Spectral Limit in EELS

  • J Aguiar, Q Ramasse, B Reed, N Browning
  • Published online by Cambridge University Press:
    08 April 2017, pp. 774-775
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Page 28 of 58