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Volume 17 - February 2011

Contents

Page 30 of 58

Instrumentation and Techniques

Advances in EELS and EFTEM

Abstract

  • Investigating the Optical Properties of Mercury (Hg) Nanoparticles Using CryoSTEM-VEELS

  • D Anjum, R Sougrat
  • Published online by Cambridge University Press:
    08 April 2017, pp. 816-817
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Phase Detection Using Low-Loss EELS with Aberration Corrected STEM

  • C Schamp, G Casillas, M Jose-Yacaman
  • Published online by Cambridge University Press:
    08 April 2017, pp. 820-821
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Low Electron Energy Loss Spectroscopy of Fluorescent Probes

  • R Felts, V Seybold
  • Published online by Cambridge University Press:
    08 April 2017, pp. 822-823
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Advanced Monochromated Low-Voltage EELS and EFTEM

  • D Bell
  • Published online by Cambridge University Press:
    08 April 2017, pp. 824-825
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Local Atomic Structural Mapping by EELS Spectral Imaging and EXELFS Analysis

  • P Lu, P Kotula
  • Published online by Cambridge University Press:
    08 April 2017, pp. 826-827
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Atomic-Resolution Imaging and In-situ EELS Study of Ferroelastic and Ferromagnetic Ordering in LaCoO3

  • T Yuan, N Orlovskaya, R Klie
  • Published online by Cambridge University Press:
    08 April 2017, pp. 828-829
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Study of Al2O3 Nanofibers Dispersed in Al Matrix by EELS and Calculations Ab Initio

  • V Gallegos-Orozco, A Santos-Beltran, R Martínez-Sánchez, F Paraguay-Delgado, F Espinosa-Magaña
  • Published online by Cambridge University Press:
    08 April 2017, pp. 830-831
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • HAADF and EELS Analysis of Ti Deposited on Si Substrate Prepared by FIB

  • A Medina-Flores, L Béjar-Gómez, J Rubio-Avalos, J Bernal
  • Published online by Cambridge University Press:
    08 April 2017, pp. 832-833
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Microanalysis Standards

Abstract

  • New U-Th-Pb Isotope Reference Material for SIMS

  • A Kennedy
  • Published online by Cambridge University Press:
    08 April 2017, pp. 836-837
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • ASTM Grain Size by EBSD - A New Standard

  • J Friel, S Wright, S Sitzman
  • Published online by Cambridge University Press:
    08 April 2017, pp. 838-839
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Developing Standard Reference Materials for Analytical Electron Microscopy

  • E Steel, J Davis, A Herzing
  • Published online by Cambridge University Press:
    08 April 2017, pp. 840-841
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • An Investigation of “San Carlos Olivine”: Comparing USNM-distributed Material with Commercially Available Material

  • J Fournelle
  • Published online by Cambridge University Press:
    08 April 2017, pp. 842-843
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Microanalysis Standards and Instrumental Calibration: Practical Improvements in Analytical Confidence

  • P Carpenter
  • Published online by Cambridge University Press:
    08 April 2017, pp. 844-845
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • The Status of the Smithsonian Microbeam Standards

  • T Rose
  • Published online by Cambridge University Press:
    09 April 2017, pp. 846-847
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • A U.S. Geological Survey Round Robin for Microanalytical Techniques

  • H Lowers, A Koenig, S Wilson, D Adams, G Meeker
  • Published online by Cambridge University Press:
    08 April 2017, pp. 848-849
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Discussion of Standard Specimens for Performance Evaluation in Atom Probe Tomography

  • B Gorman, T Kelly
  • Published online by Cambridge University Press:
    08 April 2017, pp. 850-851
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Natural Analogs of Synthetic Reference Materials: Assessing the Limits of Homogeneity Testing at the Picogram Scale

  • P Michalak, A Renno, S Merchel, F Munnik, M Wiedenbeck
  • Published online by Cambridge University Press:
    08 April 2017, pp. 852-853
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Page 30 of 58