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Volume 17 - February 2011

Contents

Page 32 of 58

Instrumentation and Techniques

Optimizing Imaging for Microanalysis: Realizing the Benefits of the New Detector Options

Abstract

  • SEMantics for High Speed Automated Particle Analysis by SEM/EDX

  • N Ritchie, V Filip
  • Published online by Cambridge University Press:
    08 April 2017, pp. 896-897
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Quantitative Chemical Phase Imaging Using Backscattered Electron Imagery, A New Approach

  • E Vicenzi, A Konicek, C Corrigan
  • Published online by Cambridge University Press:
    08 April 2017, pp. 898-899
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Unconventional Imaging with Backscattered Electrons

  • I Müllerová, Š Mikmeková, M Hovorka, L Frank
  • Published online by Cambridge University Press:
    08 April 2017, pp. 900-901
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • The Contrast Mechanisms of LL-BSE Electrons in FE-SEM Characterization of Polymer, Single Proteins, and Oxidization States of Elements

  • H Jaksch
  • Published online by Cambridge University Press:
    08 April 2017, pp. 902-903
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Solid State Backscattered Electron Detector Optimized for Minimum Detectable Energy and Maximum Scan Speed

  • A Liebel, H Soltau, R Eckhardt, O Jaritschin, A Niculae, F Schopper
  • Published online by Cambridge University Press:
    08 April 2017, pp. 904-905
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • A New Solid State Photomultiplier Device for Electron Imaging

  • N Barbi, C Piemonte, F Lopour, R Mott
  • Published online by Cambridge University Press:
    08 April 2017, pp. 906-907
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Influence of Backscattered Electron Imaging Geometry on Channeling Contrast of Dislocations

  • R Kamaladasa, Y Picard
  • Published online by Cambridge University Press:
    08 April 2017, pp. 908-909
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • STEM Dislocation Analysis and Image Simulations

  • P Phillips, M Mills, M De Graef
  • Published online by Cambridge University Press:
    08 April 2017, pp. 912-913
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Digital BSE Imaging on SEMs

  • T Agemura, T Nomaguchi, D Joy
  • Published online by Cambridge University Press:
    09 April 2017, pp. 914-915
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Exploring CCD Camera Parameters with Off-Axis Electron Holography

  • K Dudeck, E Voelkl, G Botton
  • Published online by Cambridge University Press:
    08 April 2017, pp. 916-917
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Technique for Complex Averaging of Electron Holograms

  • R McLeod, M Bergen, M Malac
  • Published online by Cambridge University Press:
    08 April 2017, pp. 918-919
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Simulation of Energy Selective signal Amplification in Gas Environment of Variable Pressure SEM

  • V Nedela, L Konvalina, B Lencová, J Zlámal
  • Published online by Cambridge University Press:
    08 April 2017, pp. 920-921
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Detection of Secondary Electrons by Scintillation Detector at VP SEM

  • J Jirak, P Čudek, V Nedela
  • Published online by Cambridge University Press:
    08 April 2017, pp. 922-923
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Construction and Testing of a Dual Faraday Cup for Low Vacuum and Environmental Scanning Electron Microscope

  • S Wight, A Konicek
  • Published online by Cambridge University Press:
    08 April 2017, pp. 924-925
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Helium Ion Microscopy of Cellular Interactions of Nanoparticles

  • B Arey, V Shutthanandan, G Orr
  • Published online by Cambridge University Press:
    08 April 2017, pp. 926-927
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Design and performance of a Near Ultra High Vacuum Helium Ion Microscope

  • R van Gastel, L Barriss, C Sanford, G Hlawacek, L Scipioni, A Merkle, D Voci, C Fenner, H Zandvliet, B Poelsema
  • Published online by Cambridge University Press:
    08 April 2017, pp. 928-929
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • High-resolution SEM Imaging with Aberration Correction for Highly Precise Measurement of Semiconductors

  • M Konno, Y Suzuki, H Inada, K Nakamura
  • Published online by Cambridge University Press:
    09 April 2017, pp. 930-931
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Advances in 3D Electron Microscopy

Abstract

  • Recent Developments in Quantitative Electron Tomography

  • P Midgley, Z Saghi, J Hindson, R Leary, D Holland, A Sederman, L Gladden, V Schmidt, N Greenham
  • Published online by Cambridge University Press:
    08 April 2017, pp. 932-933
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Ultra-High Resolution Electron Tomography for Materials Science: a Roadmap

  • K Batenburg, S Bals, S Van Aert, T Roelandts, J Sijbers
  • Published online by Cambridge University Press:
    08 April 2017, pp. 934-935
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Page 32 of 58