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Volume 17 - February 2011

Contents

Page 35 of 58

Instrumentation and Techniques

Advances in 3D Electron Microscopy

Abstract

  • Three-Dimensional Characterization of Dental Bonded Interface Degradation Using Serial Ion-Ablation Scanning Electron Microscopy

  • S Duarte, N Avishai, A Avishai, A Heuer, J Phark
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1016-1017
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Effects of Metallographic and Other Preparation Techniques on Microstructural Characterization

Abstract

  • Precipitation and “Sensitization” of Type 304L Stainless Steel: Correlation of the ASTM A262 Practice A Test with Analytical Electron Microscopy

  • B Miller, M Burke
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1020-1021
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Understanding the Manufacturing Process of Molybdenum 47.5% Rhenium Sheet Through Examination of Microstructures at Steps of Processing

  • T Leonhardt, J Johnson
  • Published online by Cambridge University Press:
    09 April 2017, pp. 1022-1023
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Image Analysis Characterization of Modern Pipe Steels Structures

  • A Kazakov, D Kiselev, E Kazakova, L Chigintsev
  • Published online by Cambridge University Press:
    09 April 2017, pp. 1024-1025
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • UV Treatment of TEM/STEM Samples for Reduced Hydrocarbon Contamination

  • D Hoyle, M Malac, M Trudeau, P Woo
  • Published online by Cambridge University Press:
    09 April 2017, pp. 1026-1027
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Large Thin Area Preparation of Cross-Sectional TEM Specimens of III-V Semiconductors

  • J-G Zheng
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1028-1029
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Metallographic Preparation Techniques for Evaluation of Co-Cr-Mo Alloys

  • C McNee, J Frafjord, M Mondo
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1030-1031
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • The Importance of Sample Preparation in the Analysis of Powder Metallurgy (PM) Materials

  • T Murphy
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1034-1035
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • A Novel Preparartion Method for Lean Duplex Steels

  • M Panzenböck, K Ragger, H Chladil, H Clemens
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1036-1037
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Delineating Prior Austenite Grain Boundaries in Carbon Steels

  • S Lawrence
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1038-1039
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Obtaining Consistent Vickers Hardness at Loads ≤ 100 Grams Force

  • G Vander Voort, R Fowler
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1040-1041
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Effects of Sample Preparation on Electron Probe Microanalysis of Alpha-Plutonium

  • T Nothwang, A Neuman, F Hampel, F Freibert
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1042-1043
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Electron Probe Microanalysis of Uranium Localization in Alpha-Plutonium

  • A Neuman, T Nothwang, F Hampel, F Freibert
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1044-1045
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Microscopy Characterization of Aqueous PVAC Glue Penetration in Double Coated Paperboard Systems

  • D Williams, B Ninness, D Ventresca, G Welsch
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1046-1047
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Microanalysis of Silver and Gold Nanoparticles Used in Surface-Enhanced Raman Spectrometric Characterization of Aminobiphenyl Isomers

  • K Donthula, J Miller, B Ooi, N Chong
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1048-1049
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Shape Controllable Synthesis of ZnO Hexagonal Arrays Via Chemical Precipitation

  • A Medina-Flores, L Béjar-Gómez, G Herrera-Pérez, J Bernal
  • Published online by Cambridge University Press:
    09 April 2017, pp. 1050-1051
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • HRTEM Analysis of Au-Cu Nanoparticles

  • A Medina-Flores, L Béjar-Gómez, L Zamora, A Medina-Almazán, J Bernal
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1052-1053
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Characterization of ε and γ′ Produced by Microwave

  • A Medina-Flores, L Béjar-Gómez, J Bernal, J Rubio-Avalos
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1054-1055
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Page 35 of 58