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Volume 17 - February 2011

Contents

Page 36 of 58

Instrumentation and Techniques

Advances in Electron Crystallography for Materials Research

Abstract

  • Being Quantitative in Reciprocal Space

  • L Marks
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1056-1057
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Electron Diffraction Imaging of Molecular Nanostructures and Molecular Motions

  • J Zuo, K Ran
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1060-1061
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Structural Fingerprinting of Nanocrystals in the Transmission Electron Microscope Supported by Open-Access Crystallographic Databases

  • P Moeck, S Rouvimov
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1062-1063
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Direct Imaging of Rhodium Crystal Surface Structures with Signal Recovery by Low Dose Microscopy

  • P Specht, D Barton, J Kang, R Cieslinski, O Dubon, C Kisielowski
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1064-1065
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Structural and Chemical Characterisation of Metal and Metal Oxide Nanoparticles

  • A Kirkland, S Haigh, N Young, H Sawada, K Takayangi
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1066-1067
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Strain Measurement by Local Diffraction: NanoBeam Electron Diffraction (NBED) Compared to Convergent Beam (CBED) and Dark Holography

  • J Rouvière, A Béché, T Denneulin, D Cooper
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1068-1069
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Diffraction from Oxide Superlattices - Stacking Sequence Effects in Plan View

  • J Spence, A Shah, U Weierstall, B Nelson-Cheeseman, A Bhattacharya
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1072-1073
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Crystal Orientation Mapping via STEM/NBD: Improved Quality with Precession Electron Diffraction and Energy Filtering

  • G Pavia, G Benner, H Niebel, E Rauch, M Véron
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1074-1075
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Reconstruction of Atomic Resolution STEM Images Using the Diffraction-Imaging Method with an Aberration-Corrected STEM

  • E Okunishi, H Sawada, Y Kondo
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1076-1077
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Automated Diffraction Tomography: A New Era for Electron Crystallography

  • A Stewart, E Mugnaioli, T Gorelik, I Andrusenko, U Kolb
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1082-1083
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Oxide Surface Crystallography in Electron Microscopy

  • J Ciston, D Su, Y Lin, L Marks, Y Zhu
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1084-1085
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Microstructure Characterization of Surface Modified 316L Stainless Steel Using an Automated Electron Diffraction Technique in the TEM

  • G Facco, A Kulovits, J Wiezorek
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1088-1089
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • D-STEM Combined with Precession Microscopy for Nanoscale Crystal Orientation and Phase Mapping

  • K Ganesh, S Rajasekhara, D Bultreys, K Hattar, J Knapp, P Ferreira
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1090-1091
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • In-situ Observations of the Complex Crystallization Processes Occurring Laser Heated Amorphous Germanium Films

  • T LaGrange, L Nikolova, M Wall, B Reed, G Campbell, B Siwick, F Rosei
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1092-1093
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Page 36 of 58