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Volume 17 - February 2011

Contents

Page 39 of 58

Instrumentation and Techniques

Tools for Science

Abstract

  • A to Z of Technology - Software for Better Results with Faster Sensors

  • S Burgess, J Goulden, A Hyde, D Redfern, N Rowlands
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1176-1177
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Retrofittable Nano-Manipulation Systems for Scanning Electron Microscope

  • P Woo, M Nakamura, D Hoyle, I Cotton, Y Zhang, B Chen, Y Zhang, Y Sun
  • Published online by Cambridge University Press:
    09 April 2017, pp. 1178-1179
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Is “There an App for That?” Take a Look at the New Portable Scanning Electron Microscopes

  • D Guarrera, A Abe, T Miyahara, Y Ohta
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1180-1181
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • The How and Why of Smart Features

  • R Anderhalt, T Nylese
  • Published online by Cambridge University Press:
    09 April 2017, pp. 1182-1183
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Development of 30-kV Cc/Cs Correction Tandem System

  • H Sawada, F Hosokawa, T Sasaki, S Yuasa, M Kawazoe, M Terao, T Kaneyama, Y Kondo, K Kimoto, K Suenaga
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1184-1185
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Results on 20kV Spectroscopy with Monochromation and In-Column Filter

  • S Pokrant, A Orchowski, G Benner, M Cheynet, U Kaiser
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1186-1187
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Image Restoration by DOG Multi-Scale Analysis

  • K Honda, K Kawauchi, T Nokuo, N Kikuchi, N Erdman
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1188-1189
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Trials to Improve Image Quality in Electron Tomography

  • T Hashimoto, T Kubo, T Yotsuji, T Oyagi, M Kawasaki, E Nakazawwa, A Wakui, T Tanaka, H Kobayashi
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1190-1191
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Automated Qualitative Element Analysis of EDS Spectra with Considering Pile-Up Distortions in High Count-Rate Modes

  • F Eggert, T Elam, R Anderhalt, J Nicolosi
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1192-1193
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • 3D Confocal Raman Imaging of Transparent and Opaque Samples

  • U Schmidt, J Yang, W Liu, A Jauss, T Dieing
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1196-1197
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • A New Electron Microscope with an Easy Operation System for Nano Analysis

  • S Kawai, M Matsushita, K Tanaka, T Iwama, N Endo, T Kuba, Y Ohkura, Y Kondo
  • Published online by Cambridge University Press:
    09 April 2017, pp. 1198-1199
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Silicon Drift Detectors for Chemical Analysis on the nm-Scale and Below

  • M Falke, A Kaeppel, R Terborg
  • Published online by Cambridge University Press:
    09 April 2017, pp. 1200-1201
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • New Design and Measurements with 60 mm2 Rococo2 SDD Detectors

  • A Niculae, M Bornschlegl, R Eckhardt, J Herrmann, O Jaritschin, P Lechner, A Liebel, H Soltau, G Schaller, F Schopper, L Strüder
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1206-1207
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Characterization of 16 MegaPixel CMOS Detector for TEM by Evaluating Single Events of Primary Electrons

  • R Ghadimi, I Daberkow, C Kofler, P Sparlinek, H Tietz
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1208-1209
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • New Type of Silicon-Based Zernike Thin-Film Phase Plate

  • S Irsen, S Pattai, P Kurth, J Wamser
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1210-1211
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Pixellated CMOS Photon Detector for Secondary Electron Detection in the Scanning Electron Microscope

  • J Chuah, D Holburn
  • Published online by Cambridge University Press:
    09 April 2017, pp. 1212-1213
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Advanced Window Grids for Work at the Intersection of Electron and Optical Imaging

  • C Striemer, T Gaborski
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1214-1215
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Page 39 of 58