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New Type of Silicon-Based Zernike Thin-Film Phase Plate

Published online by Cambridge University Press:  08 April 2017

S Irsen
Affiliation:
Center of Advanced European Studies and Research, Germany
S Pattai
Affiliation:
KonTEM Phase Contrast Systems, Germany
P Kurth
Affiliation:
KonTEM Phase Contrast Systems, Germany
J Wamser
Affiliation:
KonTEM Phase Contrast Systems, Germany

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Copyright
Copyright © Microscopy Society of America 2011