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Is “There an App for That?” Take a Look at the New Portable Scanning Electron Microscopes

Published online by Cambridge University Press:  08 April 2017

D Guarrera ,
A Abe ,
T Miyahara  and
Y Ohta
D Guarrera
Affiliation:
JEOL USA, Inc
A Abe
Affiliation:
JEOL Technics Ltd, Japan
T Miyahara
Affiliation:
JEOL Technics Ltd, Japan
Y Ohta
Affiliation:
JEOL Ltd, Japan

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 1180 - 1181
Copyright
Copyright © Microscopy Society of America 2011