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Volume 17 - February 2011

Contents

Page 42 of 58

Physical Sciences

A.V. Crewe Memorial Symposium: From Images of Single Atoms to Single Atom Spectroscopy and Beyond

Abstract

  • Vortex Beams for Atomic Resolution Dichroism

  • J Idrobo, S Pennycook
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1296-1297
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Channeling Contrast in Sub-Ångström Resolution High-Angle Annular Dark-Field Images of Planar Interfaces

  • J Liu, L Allard
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1300-1301
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Usual and Unusual Effects in ADF-STEM Imaging of Dopant Atom in Crystals

  • A Mittal, A Gunawan, K Mkhoyan
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1302-1303
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Atomic Resolution Defect Analysis Using Low Angle ADF-STEM

  • P Phillips, L Kovarik, M Mills
  • Published online by Cambridge University Press:
    09 April 2017, pp. 1304-1305
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Novel Multivariate Statistical Analysis Methods for STEM/EELS

  • M Sarahan, F de la Peña, Q Ramasse, M Walls
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1306-1307
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Auto-Tuning of Aberrations Using High-Resolution STEM Images by Auto-Correlation Function

  • H Sawada, M Watanabe, E Okunishi, Y Kondo
  • Published online by Cambridge University Press:
    09 April 2017, pp. 1308-1309
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Exploring the Strain Sensitivity of Image Contrast in Quantitative STEM of SrTiO3

  • J Zhang, J LeBeau, A D'Alfonso, L Allen, S Stemmer
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1310-1311
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Structural and Physical properties of Thin Films, Interfaces, and Grain Boundaries

Abstract

  • Some Historical Comments about Interface Research

  • M Rühle
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1312-1313
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Picometer Transmission Electron Microscopy

  • K Urban
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1314-1315
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Low kV Analysis and First Principles Study of the Structure and Bonding at SrTiO3/GaAs Hetero-Interfaces

  • Q Qiao, R Klie, S Ogut
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1318-1319
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Aberration-Corrected STEM and Atomic EELS Imaging Study of Defects and Interfaces in Thin Films of Layered Structures

  • N Gauquelin, M Couillard, H Zhang, J Wei, G Botton
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1320-1321
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Structure and Energy of Equilibrated Ni-Al2O3 Interfaces

  • H Meltzman, W Kaplan
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1322-1323
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • The Role of γ-Al2O3 Single Crystal Support to Pt Nanoparticles Construction

  • Z Zhang, L Li, L-L Wang, S Sanchez, Q Wang, D Johnson, A Frenkel, R Nuzzo, J Yang
  • Published online by Cambridge University Press:
    09 April 2017, pp. 1324-1325
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Interface and Structural Characterization of Buried CoSi2/Si(001) Nanoplatelets

  • L Montoro, A Isaac, L Giovanetti, F Requejo, A Ramirez
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1326-1327
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Wetting-Dewetting Transitions of Ultrathin Nickel Films Deposited on Silicon (100) Substrates

  • A Thron, P Greene, K Liu, K van Benthem
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1328-1329
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Formation of Single-Orientation Epitaxial Islands of TiSi2 on Si (001) using Sr Passivation

  • J Kim, A Posadas, R Dargis, M Choi, A Demkov, D Smith
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1330-1331
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Order in Nanometer-Thick Intergranular Films at Au-Sapphire Interfaces

  • M Baram, S Garofalini, W Kaplan
  • Published online by Cambridge University Press:
    09 April 2017, pp. 1332-1333
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • ABF STEM Characterization of Light Elements in Ceramic Interface

  • Y Ikuhara, R Huang, S Findlay, T Mizoguchi, N Shibata, T Hirayama
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1334-1335
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Page 42 of 58