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Aberration-Corrected STEM and Atomic EELS Imaging Study of Defects and Interfaces in Thin Films of Layered Structures

Published online by Cambridge University Press:  08 April 2017

N Gauquelin ,
M Couillard ,
H Zhang ,
J Wei  and
G Botton
N Gauquelin
Affiliation:
McMaster University
M Couillard
Affiliation:
McMaster University
H Zhang
Affiliation:
University of Toronto
J Wei
Affiliation:
Canadian Institute for Advanced Research, Toronto
G Botton
Affiliation:
McMaster University

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 1320 - 1321
Copyright
Copyright © Microscopy Society of America 2011