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Volume 17 - February 2011

Contents

Page 40 of 58

Instrumentation and Techniques

Tools for Science

Abstract

  • Characterizing a Liquid Repellent Nano-coating Using a Multi-Technique Approach

  • T Nunney, P Mack, O Greenwood, R White, M Wall, B Strohmeier, S Coulson, D Evans
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1216-1217
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Microfluidics

Abstract

  • Endothelial Cell Culture Model (ECCM) for Evaluation of Aortic Endothelial Cells Exposed to Normal and Disturbed Flow

  • R Estrada, G Giridharan, S Prabhu, P Sethu
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1218-1219
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Microtechnologies for Studying Cell Biology in Physiologically-Relevant Microenvironments

  • C Simmons
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1220-1221
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Determining the Effect of Molecular Oxygen Tension on Islet Metabolism and Endothelial Cell Morphology Using a Microfluidic Device

  • K Sankar, J Rocheleau
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1222-1223
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Examining Pancreatic Islet Lipotoxicity by Two-photon NAD(P)H imaging in a Microfluidic Device

  • J Rocheleau, M Sun, D Kilkenny
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1226-1227
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Electron Holography

Abstract

  • Low-Dose Strain Mapping by Dark-Field Inline Electron Holography

  • V Özdöl, C Koch, P van Aken
  • Published online by Cambridge University Press:
    09 April 2017, pp. 1228-1229
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Development of Sample-Scanning Electron Holography

  • M Takeguchi, K Mitsuishi, D Lei, M Shimojo
  • Published online by Cambridge University Press:
    09 April 2017, pp. 1230-1231
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Coherent Electron Interference of a Split HOLZ Line from a Strained Silicon Crystal

  • R Herring, K Saitoh, N Tanaka, T Tanji
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1232-1233
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Phase Masks for Electron Vortex Beams

  • R Herring, A Schuetze, E Humphrey
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1234-1235
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Electron Beams with Orbital Angular Momentum

  • B McMorran, A Agrawal, I Anderson, A Herzing, H Lezec, J McClelland, J Unguris
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1236-1237
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Prospects for Off-Axis Electron Holography in the TEAM I Microscope

  • M Linck, T Duden, U Dahmen
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1238-1239
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Sorby Award

Abstract

  • Reflections on Microscopy & Analysis: From Viewing the Small World to Leading on a Larger Stage

  • D Williams
  • Published online by Cambridge University Press:
    09 April 2017, pp. 1240-1241
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Physical Sciences

A.V. Crewe Memorial Symposium: From Images of Single Atoms to Single Atom Spectroscopy and Beyond

Abstract

  • Single Atom Imaging and EELS; 40 Years Ago

  • M Isaacson
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1242-1243
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Chicago Exploration Days

  • E Zeitler
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1244-1245
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Chicago Aberration Correction Work

  • V Beck
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1246-1247
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Interfacial Atomic Structure and Chemistry at Ceria Grain Boundaries

  • J Aguiar, H Yang, M Sarahan, N Browning
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1248-1249
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Single-atom Sensitive Chemical and Structural STEM Characterization of Two-Dimentional MoS2 Nano-catalysts

  • Q Ramasse, L Hansen, M Brorson, E Johnson, B Schaffer, C Kisielowski, S Helveg
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1250-1251
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Seeing the Atoms more Clearly: STEM Imaging from the Crewe Era to Today

  • S Pennycook
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1252-1253
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Efficient Elastic Imaging of Single Atoms with Aberration-Corrected Scanning Transmission Electron Microscopy

  • R Hovden, D Muller
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1254-1255
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Page 40 of 58