Skip to main content Accessibility help

We use cookies to distinguish you from other users and to provide you with a better experience on our websites. Close this message to accept cookies or find out how to manage your cookie settings.

Close cookie message
×
  1. Home
  2. Journals
  3. Microscopy and Microanalysis
  4. Volume 17
Journal Home
Refine listing

Refine listing

Access:
Publication date:
Topic: Show more

Actions for selected content:

Select all | Deselect all
  • View selected items
  • Export citations
  • Download PDF (zip)
  • Save to Kindle
  • Save to Dropbox
  • Save to Google Drive

Save Search

You can save your searches here and later view and run them again in "My saved searches".

Please provide a title, maximum of 40 characters.
Cancel
×
< Back to all issues

Volume 17 - February 2011

Contents

Page 41 of 58

Physical Sciences

A.V. Crewe Memorial Symposium: From Images of Single Atoms to Single Atom Spectroscopy and Beyond

Abstract

  • Atomic-Resolution Differential Phase Contrast Imaging by STEM

  • N Shibata, S Findlay, Y Ikuhara
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1256-1257
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Atomic-scale Interaction Dynamics in Few-layer Hexagonal Boron Nitride (h-BN)

  • N Alem, Q Ramasse, M Sarahan, R Erni, O Yazyev, K Erickson, S Louie, A Zettl
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1258-1259
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Aberration-Corrected STEM Imaging and Spectroscopy of Single-Layered Materials

  • M Chisholm, G Duscher, W Windl
  • Published online by Cambridge University Press:
    09 April 2017, pp. 1260-1261
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Quantitative Composition Measurements of Atomic Columns Using STEM; Application to L12 Precipitates

  • C Ophus, A Gautam, E Marquis, U Dahmen, V Radmilovic
  • Published online by Cambridge University Press:
    09 April 2017, pp. 1262-1263
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • CCEREM: Critical-Convergence Extended-Resolution Electron Microscopy

  • M O'Keefe, L Allard, D Blom
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1264-1265
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Atomic Resolution at 50 - 300 kV Obtained using Low Dose Rate HRTEM

  • B Barton, C Song, C Kisielowski
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1266-1267
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Observation of Defects of CuInSe2 by 300 kV Aberration Corrected Scanning Transmission Electron Microscope

  • T Tanaka, A Takeshita, T Kubota, Y Oshima, Y Tanishiro, K Takayanagi
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1268-1269
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Realization of the First Aplanatic Transmission Electron Microscope

  • I Maβmann, S Uhlemann, H Müller, P Hartel, J Zach, M Haider, Y Taniguchi, D Hoyle, R Herring
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1270-1271
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • From Early Days of Cold Field-Emission Electron Gun at Hitachi to Sub-Angstrom Holography

  • A Tonomura
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1272-1273
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • DNA Sequencing by Electron Microscopy

  • A Bleloch, C Own, M Hamalainen, J Hershleb, K Kemmish, R Koene, H Stark, J Stark, M Andregg, W Andregg
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1274-1275
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Albert Crewe's Dream Realized: Sequencing DNA with STEM

  • D Bell, W Thomas, K Murtagh, W Glover
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1276-1277
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Direct Imaging of Hydrogen Atoms in a Crystal by Annular Bright-field STEM

  • E Abe, R Ishikawa, E Okunishi, H Sawada, Y Kondo, F Hosokawa
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1278-1279
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Is There a Stobbs Factor in Atomic-Resolution STEM-EELS Mapping?

  • H Xin, C Dwyer, D Muller
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1280-1281
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Challenges in Imaging Single Atoms Adsorbed or Embedded on Surfaces

  • J Liu, L Allard
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1282-1283
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Counting Tm Dopant Atoms in and Around GaN Dots using Scannning Transmission Electron Microscopy

  • J Rouvière, H Okuno, P Jouneau, P Bayle-Guillemaud, B Daudin
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1284-1285
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Use of Aberration-Corrected STEM for Direct Structure and Chemistry Analysis of Catalytic Metal Particles

  • W Sinkler, S Bradley, L Allard, P Voyles
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1286-1287
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Nanoparticle Movement: Plasmonic Forces and Physical Constraints

  • P Batson, A Reyes-Coronado, R Barrera, A Rivacoba, P Echenique, J Aizpurua
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1288-1289
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Improving the Spatial and Energy Resolution of Aberration-Corrected STEM

  • O Krivanek, N Dellby, M Murfitt, N Bacon, G Corbin, P Hrncirik, J Nelson, T Lovejoy, G Skone, Z Szilagyi
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1290-1291
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Advances in STEM-CELL. A Free Software for TEM and STEM Analysis and Simulations: Probe Deconvolution in STEM-HAADF

  • V Grillo
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1292-1293
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Quantitative Annular Dark Field Images of Silicon (001) Crystal

  • Y Oshima, S Kim, Y Tanishiro, K Takayanagi
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1294-1295
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Page 41 of 58