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Is There a Stobbs Factor in Atomic-Resolution STEM-EELS Mapping?

Published online by Cambridge University Press:  08 April 2017

H Xin ,
C Dwyer  and
D Muller
H Xin
Affiliation:
Cornell University
C Dwyer
Affiliation:
Monash University, Australia
D Muller
Affiliation:
Cornell University

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 1280 - 1281
Copyright
Copyright © Microscopy Society of America 2011