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Trials to Improve Image Quality in Electron Tomography

Published online by Cambridge University Press:  08 April 2017

T Hashimoto ,
T Kubo ,
T Yotsuji ,
T Oyagi ,
M Kawasaki ,
E Nakazawwa ,
A Wakui ,
T Tanaka  and
H Kobayashi
T Hashimoto
Affiliation:
Hitachi High-Technologies Co, Japan
T Kubo
Affiliation:
Hitachi High-Technologies Co, Japan
T Yotsuji
Affiliation:
Hitachi High-Technologies Co, Japan
T Oyagi
Affiliation:
Hitachi High-Technologies Co, Japan
M Kawasaki
Affiliation:
Hitachi High-Technologies Co, Japan
E Nakazawwa
Affiliation:
Hitachi High-Technologies Co, Japan
A Wakui
Affiliation:
Hitachi High-Technologies Co, Japan
T Tanaka
Affiliation:
Hitachi High-Technologies Co, Japan
H Kobayashi
Affiliation:
Hitachi High-Technologies Co, Japan

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 1190 - 1191
Copyright
Copyright © Microscopy Society of America 2011