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Volume 17 - February 2011

Contents

Page 34 of 58

Instrumentation and Techniques

Advances in 3D Electron Microscopy

Abstract

  • Recovering Missing Information in Dislocation-Particle Interactions by Diffraction Contrast Dual-Axes Electron Tomography

  • G Liu, I Robertson
  • Published online by Cambridge University Press:
    08 April 2017, pp. 978-979
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Simulating STEM Imaging of Nanoparticles in Micrometers-Thick Substrates

  • N Poirier-Demers, H Demers, D Drouin, N de Jonge
  • Published online by Cambridge University Press:
    08 April 2017, pp. 980-981
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Novel Approach for 3D Chemical and Elastic State Assessment of Alloyed Strained Nanostructures

  • A Isaac, L Montoro, A Malachias, G Medeiros-Ribeiro, A Ramirez
  • Published online by Cambridge University Press:
    09 April 2017, pp. 982-983
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Phase Plate Enhanced Contrast Reveals Structure of Follicular Melanin Granules

  • G Camacho-Bragado, H Qian, F Dixon, H Bryant, M Malac
  • Published online by Cambridge University Press:
    08 April 2017, pp. 984-985
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • A Novel Multi-Modal 3D Characterization System to Quantify Grain-Level Microstructural Features in Macro-Scale Volumes

  • M Uchic, M Groeber, M Shah, A Shiveley, J Spowart
  • Published online by Cambridge University Press:
    08 April 2017, pp. 988-989
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • SEM-Based Electron Tomography of Turfs Comprised of Lineal Structures

  • O Fakron, D Field
  • Published online by Cambridge University Press:
    08 April 2017, pp. 990-991
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Three-Dimensional Measurements of Micro- to Nanometer-Scale Features at and Below the Surface Using Scanning Electron Microscopy

  • M Zhao, B Ming, P Kavuri, A Vladár
  • Published online by Cambridge University Press:
    08 April 2017, pp. 992-993
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Elemental Mapping Tomography with Surrogate Alignment

  • S Wang
  • Published online by Cambridge University Press:
    08 April 2017, pp. 994-995
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Direct Electron Detection for Electron Microscopy with an Optimized DDD® Sensor

  • L Jin, R Bilhorn
  • Published online by Cambridge University Press:
    08 April 2017, pp. 996-997
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Automated Acquisition of 3D Grain Contrast Maps of Austenitic-Ferritic Duplex Steel and Other Materials

  • L Roussel, D Wall, D Donnet
  • Published online by Cambridge University Press:
    08 April 2017, pp. 998-999
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Chemical and Structural Analysis in 3D: Combining μ-XRF, EDS, and EBSD Data Sets

  • S Scheller, J Berlin, A Käppel, T Salge, M Falke, D Goran, G Nolze, R Tagle, U Waldschläger
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1000-1001
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • A High-Speed Electron-Counting Direct Detection Camera for TEM

  • P Mooney, D Contarato, P Denes, A Gubbens, B Lee, M Lent, D Agard
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1004-1005
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Examining Dislocation Structures in Mo Pre-Strained Fibers via Electron Tomography

  • V McCreary, G Liu, J Kwon, K Johanns, P Sudharshan Phani, I Robertson, M Mills, G Pharr, E George
  • Published online by Cambridge University Press:
    09 April 2017, pp. 1006-1007
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Transmission Electron Microscopy and Three-Dimensional Tomography of Peptide-Coated Single-Walled Carbon Nanotubes

  • P Bajaj, J Nguyen, C Gilpin, G Dieckmann, C Chiu, S Nielsen, I Musselman
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1008-1009
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Molecular Dynamics Simulations of Nanoclusters for Improved STEM Image Simulations

  • R Aveyard, J Yuan, Z Li, R Johnston
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1010-1011
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Page 34 of 58