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A High-Speed Electron-Counting Direct Detection Camera for TEM

Published online by Cambridge University Press:  08 April 2017

P Mooney
Affiliation:
Gatan, Inc
D Contarato
Affiliation:
Lawrence Berkeley National Laboratory
P Denes
Affiliation:
Lawrence Berkeley National Laboratory
A Gubbens
Affiliation:
Gatan, Inc
B Lee
Affiliation:
Gatan, Inc
M Lent
Affiliation:
Gatan, Inc
D Agard
Affiliation:
University of California, San Francisco

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Copyright
Copyright © Microscopy Society of America 2011