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Bringing Standardized Processes to Atom-Probe Tomography - Part 1: Establishing Standardized Terminology

Published online by Cambridge University Press:  09 April 2017

E Marquis ,
I Anderson ,
F Danoix ,
R Forbes ,
B Gault ,
T Kelly ,
M Miller ,
M Moody  and
F Vurpillot
E Marquis
Affiliation:
University of Michigan
I Anderson
Affiliation:
National Institute for Standards & Technology
F Danoix
Affiliation:
University of Rouen
R Forbes
Affiliation:
University of Surrey
B Gault
Affiliation:
University of Sydney
T Kelly
Affiliation:
Cameca Instruments Inc
M Miller
Affiliation:
Oak Ridge National Laboratory
M Moody
Affiliation:
University of Sydney
F Vurpillot
Affiliation:
University of Rouen

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 858 - 859
Copyright
Copyright © Microscopy Society of America 2011