Proceedings of Microscopy & Microanalysis 2013
Instrumentation Sciences
A16.P1 X-ray Microanalysis in Modern Electron Optical Instruments: Is It Really Quantitative in Today's Diverse Architectures?
Abstract
Determination of the L- and M-Subshell X-Ray Production Cross Sections for Pb and U Using an Electron Microprobe
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- 09 October 2013, pp. 1280-1281
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Re-sampling of SEM-EDS Element Maps to Characterize the Length-Scale of Elemental Heterogeneity
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- 09 October 2013, pp. 1282-1283
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Th-U-Pb Dating of Lunar Granites by X-Ray Microanalysis
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- 09 October 2013, pp. 1284-1285
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Quantitative Energy Dispersive Analysis Technique of SiGe at Site-specific area using In-situ Lift-out TEM sample
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- 09 October 2013, pp. 1286-1287
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Structure and Composition Determination from Fluctuation X-ray Scattering
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- 09 October 2013, pp. 1288-1289
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Chemical Quantification of Oxygen by EDXS in the Oxidation of the Ni-Mo-W System
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- 09 October 2013, pp. 1290-1291
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Achieving Accurate Estimates of Material Composition from Spectrum Images
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- 09 October 2013, pp. 1292-1293
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A Model Unknown Glass Engineered for EPMA WDS Quality Assurance
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- 09 October 2013, pp. 1294-1295
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High-Resolution Quantification Across Vertical Interfaces using a Monte Carlo Based Reconstruction Approach
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- 09 October 2013, pp. 1296-1297
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Chemical Quantification of Atomic-scale EDS Maps under Thin Specimen Conditions
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- 09 October 2013, pp. 1298-1299
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A17.01 Vendor Symposium: Latest Developments in Tools for Life and Materials Sciences
Abstract
New Revolutionary Hybrid SEM by Carl Zeiss
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- 09 October 2013, pp. 1300-1301
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New Ultra-High Resolution SEM for Imaging by Low Energy Electrons
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- 09 October 2013, pp. 1302-1303
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Advanced Nanofabrication using Helium, Neon and Gallium Ion Beams in the Carl Zeiss Orion NanoFab Microscope
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- 09 October 2013, pp. 1304-1305
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Combined Application of EBSD and ECCI Using a Versatile 5-Axes Goniometer in an SEM
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- 09 October 2013, pp. 1306-1307
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Expanding the Boundaries of FIB-SEM Technology: Developments for Best Application Results
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- 09 October 2013, pp. 1308-1309
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The Latest Innovation on FE-SEM and Its Applications
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- 09 October 2013, pp. 1310-1311
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A17.02 Vendor Symposium: Latest Developments in Tools for Life and Materials Sciences
Abstract
High Throughput, High Quality Analysis in the Electron Microscope
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- 09 October 2013, pp. 1312-1313
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Recent Advancements in Laboratory X-ray Microscopes enabling 3D and 4D Science
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- 09 October 2013, pp. 1314-1315
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An Improved Low Energy X-ray Transmission Window
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- 09 October 2013, pp. 1316-1317
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High Spatial Resolution, Energy Resolved Imaging with the pnCCD Color X-ray Camera
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- 09 October 2013, pp. 1318-1319
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