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Proceedings of Microscopy & Microanalysis 2013

Volume 19 - Issue S2 - August 2013
Contents

Page 33 of 52

Instrumentation Sciences

A16.P1 X-ray Microanalysis in Modern Electron Optical Instruments: Is It Really Quantitative in Today's Diverse Architectures?

Abstract

  • Determination of the L- and M-Subshell X-Ray Production Cross Sections for Pb and U Using an Electron Microprobe

  • A. Moy, C. Merlet, X. Llovet, O. Dugne
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1280-1281
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Re-sampling of SEM-EDS Element Maps to Characterize the Length-Scale of Elemental Heterogeneity

  • C.S. Todd, W. Heeschen
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1282-1283
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Th-U-Pb Dating of Lunar Granites by X-Ray Microanalysis

  • S.M. Seddio, B.L. Jolliff, R.L. Korotev, P.K. Carpenter
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1284-1285
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Structure and Composition Determination from Fluctuation X-ray Scattering

  • D. Li
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1288-1289
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Chemical Quantification of Oxygen by EDXS in the Oxidation of the Ni-Mo-W System

  • C. Angeles-Chavez, J.A. Toledo-Antonio, M.A. Cortes-Jacome
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1290-1291
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Achieving Accurate Estimates of Material Composition from Spectrum Images

  • P.J. Statham
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1292-1293
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • A Model Unknown Glass Engineered for EPMA WDS Quality Assurance

  • D.C. Meier, J.M. Davis, J.R. Anderson, S.A. Wight
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1294-1295
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • High-Resolution Quantification Across Vertical Interfaces using a Monte Carlo Based Reconstruction Approach

  • S. Richter, P.T. Pinard, N. Mevemkamp, M. Torrilhon
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1296-1297
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Chemical Quantification of Atomic-scale EDS Maps under Thin Specimen Conditions

  • P. Lu, M. Van Benthem, Q. Jia
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1298-1299
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

A17.01 Vendor Symposium: Latest Developments in Tools for Life and Materials Sciences

Abstract

  • New Revolutionary Hybrid SEM by Carl Zeiss

  • M. Bolorizadeh, F. Panteleit, F. Hitzel
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1300-1301
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • New Ultra-High Resolution SEM for Imaging by Low Energy Electrons

  • J. Jiruse, M. Havelka, J. Polster, F. Lopour
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1302-1303
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Advanced Nanofabrication using Helium, Neon and Gallium Ion Beams in the Carl Zeiss Orion NanoFab Microscope

  • D. Elswick, M. Ananth, L. Stern, J. Marshman, D. Ferranti, C. Huynh
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1304-1305
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Combined Application of EBSD and ECCI Using a Versatile 5-Axes Goniometer in an SEM

  • S. Zaefferer, S. Kleindiek, K. Schock, B. Volbert
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1306-1307
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Expanding the Boundaries of FIB-SEM Technology: Developments for Best Application Results

  • I. Schulmeyer, M. Kienle
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1308-1309
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • The Latest Innovation on FE-SEM and Its Applications

  • S. Takeuchi, H. Sato, O. Takagi, D. Hoyle
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1310-1311
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

A17.02 Vendor Symposium: Latest Developments in Tools for Life and Materials Sciences

Abstract

  • High Throughput, High Quality Analysis in the Electron Microscope

  • A. Hyde, J. Goulden, N. Rowlands, S. Ubhi
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1312-1313
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Recent Advancements in Laboratory X-ray Microscopes enabling 3D and 4D Science

  • A. Merkle, J. Gelb
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1314-1315
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • An Improved Low Energy X-ray Transmission Window

  • S. Liddiard, M. Coffin, M. Zappe, J. Abbott, C. Hustedt, K. Zufelt, L. Pei, J. Lund, R. Vanfleet, R. Davis
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1316-1317
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • High Spatial Resolution, Energy Resolved Imaging with the pnCCD Color X-ray Camera

  • S. Ihle, H. Ryll, H. Soltau, A. Liebel, O. Scharf, A. Bjeoumikhov, M. Schmidt, L. Strüder
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1318-1319
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Page 33 of 52