Combined Application of EBSD and ECCI Using a Versatile 5-Axes Goniometer in an SEM

S. Zaefferer; S. Kleindiek; K. Schock; B. Volbert

doi:10.1017/S1431927613008520

Combined Application of EBSD and ECCI Using a Versatile 5-Axes Goniometer in an SEM

Published online by Cambridge University Press: 09 October 2013

K. Schock and

S. Zaefferer: Affiliation:
S. Kleindiek: Affiliation:
K. Schock: Affiliation:
B. Volbert: Affiliation:

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Abstract

Abstract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type: Abstract
Information: Microscopy and Microanalysis , Volume 19 , Issue S2: Proceedings of Microscopy & Microanalysis 2013 , August 2013 , pp. 1306 - 1307

DOI: https://doi.org/10.1017/S1431927613008520 [Opens in a new window]

Article contents

Combined Application of EBSD and ECCI Using a Versatile 5-Axes Goniometer in an SEM

Abstract

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